21
TITLE: DETECTOR: Design and test characterization of mixed-signal power cores
AUTHORS: Moita, TH; Almeida, CB ; Dos Santos, MB ;
PUBLISHED: 2010, SOURCE: 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2010 in Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2010
INDEXED IN: Scopus CrossRef
IN MY: ORCID
22
TITLE: Low-sensitivity to process variations aging sensor for automotive safety-critical applications
AUTHORS: Vazquez, JC; Champac, V; Ziesemer, AM; Reis, R; Teixeira, IC ; Santos, MB ; Teixeira, JP ;
PUBLISHED: 2010, SOURCE: 28th IEEE VLSI Test Symposium, VTS10 in Proceedings of the IEEE VLSI Test Symposium
INDEXED IN: Scopus CrossRef
IN MY: ORCID
23
TITLE: Predictive error detection by on-line aging monitoring
AUTHORS: Vazquez, JC; Champac, V; Ziesemer, AM; Reis, R; Jorge Semião ; Teixeira, IC ; Santos, MB ; Teixeira, JP ;
PUBLISHED: 2010, SOURCE: 16th IEEE International On-Line Testing Symposium, IOLTS 2010 in Proceedings of the 2010 IEEE 16th International On-Line Testing Symposium, IOLTS 2010
INDEXED IN: Scopus CrossRef
IN MY: ORCID
24
TITLE: Programmable aging sensor for automotive safety-critical applications
AUTHORS: Vazquez, JC; Champac, V; Teixeira, IC ; Santos, MB ; Teixeira, JP ;
PUBLISHED: 2010, SOURCE: Design, Automation and Test in Europe Conference and Exhibition, DATE 2010 in Proceedings -Design, Automation and Test in Europe, DATE
INDEXED IN: Scopus
IN MY: ORCID
25
TITLE: A 100 mA Fractional Step-Down Charge Pump with Digital Control
AUTHORS: Valter A L Sadio; Abilio E M Parreira; Marcelino B Santos ;
PUBLISHED: 2009, SOURCE: Conference on VLSI Circuits and Systems IV in VLSI CIRCUITS AND SYSTEMS IV, VOLUME: 7363
INDEXED IN: Scopus WOS
IN MY: ORCID
26
TITLE: Built-In Aging Monitoring for Safety-Critical Applications  Full Text
AUTHORS: Vazquez, JC; Champac, V; Ziesemer, AM; Reis, R; Teixeira, IC ; Santos, MB ; Teixeira, JP ;
PUBLISHED: 2009, SOURCE: 15th IEEE International On-Line Testing Symposium in 2009 15TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM
INDEXED IN: Scopus WOS CrossRef
27
TITLE: Controllability and Observability in Mixed Signal Cores  Full Text
AUTHORS: Jose Rocha; Nuno Dias; Angelo Monteiro; Alexandre Neves; Gabriel Santos; Marcelino Santos ; Teixeira, JP ;
PUBLISHED: 2009, SOURCE: 15th IEEE International On-Line Testing Symposium in 2009 15TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM
INDEXED IN: Scopus WOS CrossRef
28
TITLE: Delay-Fault Tolerance to Power Supply Voltage Disturbances Analysis in Nanometer Technologies  Full Text
AUTHORS: Jorge Semião ; Freijedo, J; Rodriguez Andina, J; Vargas, F; Santos, M ; Teixeira, I ; Teixeira, P;
PUBLISHED: 2009, SOURCE: 15th IEEE International On-Line Testing Symposium in 2009 15TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM
INDEXED IN: Scopus WOS CrossRef
29
TITLE: Gate driver voltage optimization for multi-mode low power DC-DC conversion
AUTHORS: Dias, N; Santos, M ; Monteiro, A; Braga, P; Neves, A;
PUBLISHED: 2009, SOURCE: Journal of Low Power Electronics, VOLUME: 5, ISSUE: 2
INDEXED IN: Scopus CrossRef
IN MY: ORCID
30
TITLE: Limiting Internal Supply Voltage Spikes in DC-DC Converters
AUTHORS: Jose Rocha; Marcelino Santos ; Gabriel Santos; Angelo Monteiro; Alexandre Neves; Pedro Braga;
PUBLISHED: 2009, SOURCE: IEEE International Symposium on Industrial Electronics (ISIE 2009) in ISIE: 2009 IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS
INDEXED IN: Scopus WOS CrossRef
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