Francisco Andre Correa Alegria


AuthID: R-000-59K

Confirmed Publications: 71



41
TITLE: Proposal for high accuracy linearity test of triangular waveform generators
AUTHORS: Correa C Alegria ;
PUBLISHED: 2007, SOURCE: 8th IEEE Africon Conference in 2007 AFRICON, VOLS 1-3
INDEXED IN: WOS
42
TITLE: Standard histogram test precision of ADC gain and offset error estimation
AUTHORS: Francisco Correa Alegria ; Antonio Cruz Serra ;
PUBLISHED: 2007, SOURCE: 22nd IEEE Instrumentation and Measurement Technology Conference in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 56, ISSUE: 5
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
43
TITLE: Time base error characterization of a data recorder aimed for marine seismology
AUTHORS: Shariat S Panahi; Correa C Alegria ; Manuel, A; Cruz C Serral;
PUBLISHED: 2007, SOURCE: 24th IEEE Instrumentation and Measurement Technology Conference in 2007 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
INDEXED IN: Scopus WOS
IN MY: ORCID
44
TITLE: ADC transfer curve types - A review  Full Text
AUTHORS: Alegria, FC ; Serra, AC ;
PUBLISHED: 2006, SOURCE: COMPUTER STANDARDS & INTERFACES, VOLUME: 28, ISSUE: 5
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
45
TITLE: Fast ADC testing by repetitive histogram analysis  Full Text
AUTHORS: Serra, AC ; Alegria, F ; Michaeli, L; Michalko, P; Saliga, J;
PUBLISHED: 2006, SOURCE: IMTC'06 - IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference
INDEXED IN: Scopus CrossRef
IN MY: ORCID
46
TITLE: Fast ADC testing by repetitive histogram analysis  Full Text
AUTHORS: Serra, AC ; Alegria, F ; Michaeli, L; Michalko, P; Saliga, J;
PUBLISHED: 2006, SOURCE: 23rd IEEE Instrumentation and Measurement Technology Conference in 2006 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS, VOLS 1-5
INDEXED IN: WOS CrossRef
47
TITLE: The histogram test of ADCs is unbiased by phase noise  Full Text
AUTHORS: Alegria, FC ; Serra, AC ;
PUBLISHED: 2006, SOURCE: 23rd IEEE Instrumentation and Measurement Technology Conference in 2006 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS, VOLS 1-5
INDEXED IN: WOS CrossRef
48
TITLE: The histogram test of ADCs is unbiased by phase noise  Full Text
AUTHORS: Alegria, FC ; Serra, AC ;
PUBLISHED: 2006, SOURCE: IMTC'06 - IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference
INDEXED IN: Scopus CrossRef
IN MY: ORCID
49
TITLE: Uncertainty of the estimates of sine wave fitting of digital data in the presence of additive noise  Full Text
AUTHORS: Alegria, FC ; Serra, AC ;
PUBLISHED: 2006, SOURCE: 23rd IEEE Instrumentation and Measurement Technology Conference in 2006 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS, VOLS 1-5
INDEXED IN: WOS CrossRef
50
TITLE: Uncertainty of the estimates of sine wave fitting of digital data in the presence of additive noise  Full Text
AUTHORS: Alegria, FC ; Serra, AC ;
PUBLISHED: 2006, SOURCE: IMTC'06 - IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference
INDEXED IN: Scopus CrossRef
IN MY: ORCID
Page 5 of 8. Total results: 71.

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