171
TITLE: Advanced materials for the next generation of thin film transistors
AUTHORS: Elvira Fortunato ; Pedro Barquinha ; Luis Pereira ; Gongalo Goncalves; Rodrigo Martins ;
PUBLISHED: 2007, SOURCE: 7th International Display Manufacturing Conference (IDMC 07) in IDMC'07: PROCEEDINGS OF THE INTERNATIONAL DISPLAY MANUFACTURING CONFERENCE 2007
INDEXED IN: Scopus WOS
172
TITLE: Amorphous IZO TTFTs with saturation mobilities exceeding 100 cm(2)/Vs  Full Text
AUTHORS: Fortunato, E ; Barquinha, P ; Pimentel, A ; Pereira, L ; Goncalves, G; Martins, R ;
PUBLISHED: 2007, SOURCE: PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, VOLUME: 1, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
173
TITLE: Characterization of nickel induced crystallized silicon by spectroscopic ellipsornetry
AUTHORS: Luis Pereira ; Hugo Aguas ; Manfred Beckers; Rui M S Martins ; Elvira Fortunato ; Rodrigo Martins ;
PUBLISHED: 2007, SOURCE: Symposium on Amorphous and Polycrystalline Thin-Film Silicon Science and Technology held at the 2006 MRS Spring Meeting in AMORPHOUS AND POLYCRYSTALLINE THIN-FILM SILICON SCIENCE AND TECHNOLOGY 2006, VOLUME: 910
INDEXED IN: Scopus WOS
174
TITLE: Corrigendum to "Nickel assisted metal induced crystallization of silicon: Effect of native silicon oxide layer"  Full Text
AUTHORS: Pereira, L ; Martins, RMS ; Schell, N; Fortunato, E ; Martins, R ;
PUBLISHED: 2007, SOURCE: THIN SOLID FILMS, VOLUME: 516, ISSUE: 1
INDEXED IN: Scopus WOS
176
TITLE: Effect of annealing temperature on the properties of IZO films and IZO based transparent TFTs  Full Text
AUTHORS: Barquinha, P ; Goncalves, G; Pereira, L ; Martins, R ; Fortunato, E ;
PUBLISHED: 2007, SOURCE: 1st International Symposium on Transparent Conducting Oxides in THIN SOLID FILMS, VOLUME: 515, ISSUE: 24
INDEXED IN: Scopus WOS CrossRef
177
TITLE: In-situ study of Ni-Ti thin film growth on a TiN intermediate layer by X-ray diffraction  Full Text
AUTHORS: Martins, RMS ; Schell, N; Silva, RJC ; Pereira, L ; Mahesh, KK; Braz Fernandes, FMB ;
PUBLISHED: 2007, SOURCE: Symposium on Functional Materials for Micro and Nanosystems in SENSORS AND ACTUATORS B-CHEMICAL, VOLUME: 126, ISSUE: 1
INDEXED IN: Scopus WOS
178
TITLE: In-situ study of Ni–Ti thin film growth on a TiN intermediate layer by X-ray diffraction  Full Text
AUTHORS: MARTINS, R; SCHELL, N; SILVA, R; PEREIRA, L ; MAHESH, K; FERNANDES, F;
PUBLISHED: 2007, SOURCE: Sensors and Actuators B: Chemical, VOLUME: 126, ISSUE: 1
INDEXED IN: CrossRef
179
TITLE: Influence of post-annealing temperature on the properties exhibited by ITO, IZO and GZO thin films  Full Text
AUTHORS: Goncalves, G; Elangovan, E; Barquinha, P ; Pereira, L ; Martins, R ; Fortunato, E ;
PUBLISHED: 2007, SOURCE: 1st International Symposium on Transparent Conducting Oxides in THIN SOLID FILMS, VOLUME: 515, ISSUE: 24
INDEXED IN: Scopus WOS
180
TITLE: Influence of post-annealing temperature on the properties exhibited by ITO, IZO and GZO thin films  Full Text
AUTHORS: Gonçalves, G; Elangovan, E; Barquinha, P; Pereira, L ; Martins, R; Fortunato, E ;
PUBLISHED: 2007, SOURCE: Thin Solid Films, VOLUME: 515, ISSUE: 24
INDEXED IN: CrossRef
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