ProfileOfResearchers

101

TITLE: Developments in diffusion bonding and brazing of advanced materials
AUTHORS: Vieira, Manuel ; Vieira, MT; Ramos, AS ; Simoes, S ; Viana, Filomena ;
PUBLISHED: 2010, SOURCE: International Conference on Advances in Welding Science and Technology for Construction, Energy and Transportation, AWST 2010, held in Conjunction with the 63rd Annual Assembly of the International Institute of Welding, IIW 2010 in Proc. of the Int. Conf. on Advances in Welding Science and Technology for Construction, Energy and Transportation, AWST 2010, held in Conj. with the 63rd Annual Assembly of IIW 2010

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102

TITLE: Diffusion bonding of TiAl using Ni/Al multilayers Full Text
AUTHORS: Sonia Simoes ; Viana, Filomena ; Volker Ventzke; Mustafa Kocak; Sofia S Ramos ; Teresa T Vieira ; Vieira, Manuel ;
PUBLISHED: 2010, SOURCE: Conference on High-Temperature Joining (EUROMAT 2009) in JOURNAL OF MATERIALS SCIENCE, VOLUME: 45, ISSUE: 16

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103

TITLE: In situ TEM study of grain growth in nanocrystalline copper thin films Full Text
AUTHORS: Simoes, S ; Calinas, R; Vieira, MT ; Vieira, Manuel ; Ferreira, PJ;
PUBLISHED: 2010, SOURCE: NANOTECHNOLOGY, VOLUME: 21, ISSUE: 14

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104

TITLE: Reaction-assisted diffusion bonding of advanced materials
AUTHORS: Ramos, AS ; Vieira, MT; Simoes, S ; Viana, Filomena ; Vieira, Manuel ;
PUBLISHED: 2010, SOURCE: Defect and Diffusion Forum, VOLUME: 297-301

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CrossRef: 17

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105

TITLE: Solid-state diffusion bonding of TiAl by nanostructured materials
AUTHORS: Simoes, S ; Viana, Filomena ; Ventzke, V; Kocak, M; Ramos, AS ; Vieira, MT; Vieira, Manuel ;
PUBLISHED: 2010, SOURCE: International Conference on Advances in Welding Science and Technology for Construction, Energy and Transportation, AWST 2010, held in Conjunction with the 63rd Annual Assembly of the International Institute of Welding, IIW 2010 in Proc. of the Int. Conf. on Advances in Welding Science and Technology for Construction, Energy and Transportation, AWST 2010, held in Conj. with the 63rd Annual Assembly of IIW 2010

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106

TITLE: TEM Characterization of As-Deposited and Annealed Ni/Al Multilayer Thin Film
AUTHORS: Simoes, S ; Viana, Filomena ; Ramos, AS ; Vieira, MT ; Vieira, Manuel ;
PUBLISHED: 2010, SOURCE: MICROSCOPY AND MICROANALYSIS, VOLUME: 16, ISSUE: 6

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CrossRef: 9

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107

TITLE: Intermixing in Ni/Al multilayer thin films
AUTHORS: Simoes, S ; Viana, Filomena ; Ramos, AS; Vieira, MT; Vieira, Manuel ;
PUBLISHED: 2009, SOURCE: Microscopy and Microanalysis, VOLUME: 15, ISSUE: SUPPL.3

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CrossRef: 4

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108

TITLE: Joining of Superalloys to Intermetallics Using Nanolayers
AUTHORS: Ramos, AS ; Vieira, MT ; Simoes, S ; Viana, Filomena ; Vieira, Manuel ;
PUBLISHED: 2009, SOURCE: 1st International Conference on New Materials for Extreme Environments in 1ST INTERNATIONAL CONFERENCE ON NEW MATERIALS FOR EXTREME ENVIRONMENTS, VOLUME: 59

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CrossRef: 39

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109

TITLE: Joining of TiAl alloys using Ni/Al multilayers
AUTHORS: Simoes, S ; Viana, Filomena ; Ventzke, V; Kocak, M; Ramos, AS; Vieira, MT; Vieira, Manuel ;
PUBLISHED: 2009, SOURCE: Microscopy and Microanalysis, VOLUME: 15, ISSUE: SUPPL.3

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110

TITLE: Microstructure and reaction mechanisms at γ-TiAl brazed interfaces
AUTHORS: Guedes, A; Pinto, AMP; Sequeiros, EW; Vieira, Manuel ; Viana, Filomena ;
PUBLISHED: 2009, SOURCE: Microscopy and Microanalysis - Microsc Microanal, VOLUME: 15, ISSUE: S3

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