141
TITLE: <title>Noninvasive microtomographic inspection of rough surfaces by active triangulation</title>
AUTHORS: Manuel F M Costa ;
PUBLISHED: 2001, SOURCE: Laser Metrology for Precision Measurement and Inspection in Industry
INDEXED IN: CrossRef
143
TITLE: <title>Thin films residual stress measurement by optical profilometry</title>
AUTHORS: Manuel F M Costa ;
PUBLISHED: 2001, SOURCE: Advanced Photonic Sensors and Applications II
INDEXED IN: CrossRef
144
TITLE: Microtopographic characterization of graded Cr-Cr2O3 cermet solar coatings
AUTHORS: Costa, MFM ; Teixeira, V ;
PUBLISHED: 2001, SOURCE: 4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications in 4TH IBEROAMERICAN MEETING ON OPTICS AND 7TH LATIN AMERICAN MEETING ON OPTICS, LASERS, AND THEIR APPLICATIONS, VOLUME: 4419
INDEXED IN: Scopus WOS
145
TITLE: Microtopographic inspection of thermoplastic rubber shoe's sole. The influence of surface roughness on sole to leather gluing  Full Text
AUTHORS: Costa, MFM ; Pinho, V;
PUBLISHED: 2001, SOURCE: NDT & E INTERNATIONAL, VOLUME: 34, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
146
TITLE: Non invasive microtopographic inspection of rough surfaces by active triangulation
AUTHORS: Costa, MFM ;
PUBLISHED: 2001, SOURCE: International Symposium on Laser Metrology for Precision Measurement and Inspection in Industry in LASER METROLOGY FOR PRECISION MEASUREMENT AND INSPECTION IN INDUSTRY, VOLUME: 4420
INDEXED IN: Scopus WOS
147
TITLE: Spectrally selective composite coatings of Cr-Cr2O3 and Mo-Al2O3 for solar energy applications  Full Text
AUTHORS: Teixeira, V ; Sousa, E; Costa, MF ; Nunes, C; Rosa, L; Carvalho, MJ; Collares Pereira, M; Roman, E; Gago, J;
PUBLISHED: 2001, SOURCE: 3rd International Conference on Coatings and Glass (ICCG) in THIN SOLID FILMS, VOLUME: 392, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
148
TITLE: Thickness and topographic inspection of RPG contact lenses by optical triangulation
AUTHORS: Costa, MFM ;
PUBLISHED: 2001, SOURCE: 11th Conference on Ophthalmic Technologies XI in OPHTHALMIC TECHNOLOGIES XI, VOLUME: 2, ISSUE: 2
INDEXED IN: Scopus WOS
149
TITLE: Thin films' residual stress measurement by optical profilometry
AUTHORS: Costa, MFM ;
PUBLISHED: 2001, SOURCE: Advanced Photonic Sensors and Applications II Conference in ADVANCED PHOTONIC SENSORS AND APPLICATIONS II, VOLUME: 4596
INDEXED IN: Scopus WOS
Page 15 of 20. Total results: 194.