Maria Jesus Matos Gomes


AuthID: R-000-BSX

Confirmed Publications: 124



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TITLE: Influence of annealing conditions on the formation of regular lattices of voids and Ge quantum dots in an amorphous alumina matrix  Full Text
AUTHORS: Pinto, SRC; Buljan, M; Marques, L ; Martin Sanchez, J; Conde, O ; Chahboun, A ; Ramos, AR ; Barradas, NP ; Alves, E ; Bernstorff, S; Grenzer, J; Muecklich, A; Ramos, MMD ; Gomes, MJM ;
PUBLISHED: 2012, SOURCE: NANOTECHNOLOGY, VOLUME: 23, ISSUE: 40
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
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TITLE: Structural and electrical studies of ultrathin layers with Si0.7Ge0.3 nanocrystals confined in a SiGe/SiO2 superlattice  Full Text
AUTHORS: Vieira, EMF; Martin Sanchez, J; Rolo, AG ; Parisini, A; Buljan, M; Capan, I; Alves, E ; Barradas, NP ; Conde, O ; Bernstorff, S; Chahboun, A ; Levichev, S ; Gomes, MJM ;
PUBLISHED: 2012, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 111, ISSUE: 10
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
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TITLE: Tuning the properties of Ge-quantum dots superlattices in amorphous silica matrix through deposition conditions  Full Text
AUTHORS: Pinto, SRC; Buljan, M; Chahboun, A ; Roldan, MA; Bernstorff, S; Varela, M; Pennycook, SJ; Barradas, NP ; Alves, E ; Molina, SI; Ramos, MMD ; Gomes, MJM ;
PUBLISHED: 2012, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 111, ISSUE: 7
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
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TITLE: Influence of the deposition parameters on the growth of SiGe nanocrystals embedded in Al2O3 matrix  Full Text
AUTHORS: Vieira, EMF; Pinto, SRC; Levichev, S ; Rolo, AG ; Chahboun, A ; Buljan, M; Barradas, NP ; Alves, E ; Bernstorff, S; Conde, O ; Gomes, MJM ;
PUBLISHED: 2011, SOURCE: EMRS 2010 Spring Meeting on Post-Si-CMOS Electronic Devices - The Role of Ge and III-V Materials in MICROELECTRONIC ENGINEERING, VOLUME: 88, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
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TITLE: Low-temperature fabrication of layered self-organized Ge clusters by RF-sputtering  Full Text
AUTHORS: Sara R C Pinto; Anabela G Rolo ; Maja Buljan; Adil Chahboun ; Sigrid Bernstorff; Nuno P Barradas ; Eduardo Alves ; Reza J Kashtiban; Ursel Bangert; Maria J M Gomes ;
PUBLISHED: 2011, SOURCE: NANOSCALE RESEARCH LETTERS, VOLUME: 6, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
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TITLE: Determination of residual stress in PZT films produced by laser ablation with X-ray diffraction and Raman spectroscopy  Full Text
AUTHORS: Rodrigues, SAS; Rolo, AG ; Khodorov, A ; Pereira, M ; Gomes, MJM ;
PUBLISHED: 2010, SOURCE: 11th Electroceramics Conference 2008 in JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, VOLUME: 30, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
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TITLE: Formation of void lattice after annealing of Ge quantum dot lattice in alumina matrix  Full Text
AUTHORS: Pinto, SRC; Rolo, AG ; Gomes, MJM ; Ivanda, M; Bogdanovic Radovic, I; Grenzer, J; Muecklich, A; Barber, DJ; Bernstorff, S; Buljan, M;
PUBLISHED: 2010, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 97, ISSUE: 17
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
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