Nuno Pessoa Barradas


AuthID: R-000-DV0

Confirmed Publications: 263



11
TITLE: On the formation of an interface amorphous layer in nanostructured ferroelectric Ba0.8Sr0.2TiO3 thin films integrated on Pt-Si and its effect on the electrical properties  Full Text
AUTHORS: Silva, JPB; Sekhar, KC ; Rodrigues, SAS; Pereira, M; Parisini, A; Alves, E ; Barradas, NP ; Gomes, MJM ;
PUBLISHED: 2013, SOURCE: Spring Meeting of the European-Materials-Research-Society (E-MRS) / Symposium N / Symposium O / Symposium V on Laser Materials Processing for Micro and Nano Applications in APPLIED SURFACE SCIENCE, VOLUME: 278
INDEXED IN: Scopus WOS CrossRef
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12
TITLE: On the growth kinetics of Ni(Pt) silicide thin films  Full Text
AUTHORS: Demeulemeester, J; Smeets, D; Comrie, CM; Barradas, NP ; Vieira, A; Van Bockstael, C; Detavernier, C; Temst, K; Vantomme, A;
PUBLISHED: 2013, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 113, ISSUE: 16
INDEXED IN: Scopus WOS CrossRef
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13
TITLE: Properties of tantalum oxynitride thin films produced by magnetron sputtering: The influence of processing parameters  Full Text
AUTHORS: Cristea, D; Constantin, D; Crisan, A; Abreu, CS; Gomes, JR ; Barradas, NP ; Alves, E ; Moura, C; Vaz, F ; Cunha, L ;
PUBLISHED: 2013, SOURCE: VACUUM, VOLUME: 98
INDEXED IN: Scopus WOS CrossRef
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14
TITLE: Status of the MARE Experiment  Full Text
AUTHORS: Ribeiro Gomes, MR; Gatti, F; Nucciotti, A; Manfrinetti, P; Galeazzi, M; Alves, E ; Bagliani, D; Barradas, N ; Basak, S; Biasotti, M; Ferri, E; Kling, A ; Pizzigoni, G; Prasai, K; Rocha, J;
PUBLISHED: 2013, SOURCE: IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, VOLUME: 23, ISSUE: 3
INDEXED IN: Scopus WOS CrossRef
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16
TITLE: Accurate Determination of Quantity of Material in Thin Films by Rutherford Backscattering Spectrometry  Full Text
AUTHORS: Jeynes, C; Barradas, NP ; Szilagyi, E;
PUBLISHED: 2012, SOURCE: ANALYTICAL CHEMISTRY, VOLUME: 84, ISSUE: 14
INDEXED IN: Scopus WOS CrossRef
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17
TITLE: Analysis of multifunctional titanium oxycarbide films as a function of oxygen addition  Full Text
AUTHORS: Chappe, JM; Fernandes, AC; Moura, C ; Alves, E ; Barradas, NP ; Martin, N; Espinos, JP; Vaz, F ;
PUBLISHED: 2012, SOURCE: SURFACE & COATINGS TECHNOLOGY, VOLUME: 206, ISSUE: 8-9
INDEXED IN: Scopus WOS
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18
TITLE: Characterization of nanostructured HfO2 films using RBS and PAC  Full Text
AUTHORS: Cavalcante, FHM; Gomes, MR; Carbonari, AW; Pereira, LFD; Rossetto, DA; Costa, MS; Alves, E ; Barradas, NP ; Franco, N; Redondo, LM ; Lopes, AML ; Soares, JC ;
PUBLISHED: 2012, SOURCE: 20th International Conference on Ion Beam Analysis (IBA) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 273
INDEXED IN: Scopus WOS CrossRef: 1
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19
TITLE: Electrical properties of AlNxOy thin films prepared by reactive magnetron sputtering  Full Text
AUTHORS: Borges, J; Martin, N; Barradas, NP ; Alves, E ; Eyidi, D; Beaufort, MF; Riviere, JP; Vaz, F ; Marques, L ;
PUBLISHED: 2012, SOURCE: THIN SOLID FILMS, VOLUME: 520, ISSUE: 21
INDEXED IN: Scopus WOS CrossRef
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20
TITLE: High precision determination of the InN content of Al1-xInxN thin films by Rutherford backscattering spectrometry  Full Text
AUTHORS: Magalhaes, S; Barradas, NP ; Alves, E ; Watson, IM; Lorenz, K ;
PUBLISHED: 2012, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 273
INDEXED IN: Scopus WOS
IN MY: ORCID | ResearcherID
Page 2 of 27. Total results: 263.

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