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Pedro Miguel Pinto Ramos
AuthID:
R-000-F0Z
Publications
Confirmed
To Validate
Document Source:
All
Document Type:
All Document Types
Proceedings Paper (74)
Article (71)
Editorial Material (4)
Review (1)
Correction (1)
Book Chapter (1)
Article in Press (1)
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Order:
Year Dsc
Year Asc
Cit. WOS Dsc
IF WOS Dsc
Cit. Scopus Dsc
IF Scopus Dsc
Title Asc
Title Dsc
Results:
10
20
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50
Confirmed Publications: 153
11
TITLE:
How Signal Processing is Changing Impedance Spectroscopy
AUTHORS:
Ramos, PM
;
PUBLISHED:
2018
,
SOURCE:
2018 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018
in
2018 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC): DISCOVERING NEW HORIZONS IN INSTRUMENTATION AND MEASUREMENT
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
|
CIÊNCIAVITAE
12
TITLE:
On the importance of magnetic material characterization for the design of particle accelerator magnets
AUTHORS:
Anglada, JR; Arpaia, P; Buzio, M; Liccardo, A; Parrella, A; Pentella, M;
Ramos, PM
;
PUBLISHED:
2018
,
SOURCE:
22nd World Congress of the International Measurement Confederation, IMEKO 2018
in
Journal of Physics: Conference Series,
VOLUME:
1065,
ISSUE:
5
INDEXED IN:
Scopus
CrossRef
:
2
IN MY:
ORCID
|
CIÊNCIAVITAE
13
TITLE:
Threshold estimation for least-squares fitting in impedance spectroscopy
AUTHORS:
Janeiro, FM
;
Ramos, PM
;
PUBLISHED:
2018
,
SOURCE:
MEASUREMENT,
VOLUME:
124
INDEXED IN:
Scopus
WOS
CrossRef
:
3
IN MY:
ORCID
|
CIÊNCIAVITAE
14
TITLE:
A portable embedded contactless system for the measurement of metallic material conductivity and lift-off
AUTHORS:
Rodrigues, NM; Rosado, LS;
Ramos, PM
;
PUBLISHED:
2017
,
SOURCE:
21st IMEKO TC-4 International Symposium on Understanding the World through Electrical and Electronic Measurement / 19th International Workshop on ADC Modelling and Testing
in
MEASUREMENT,
VOLUME:
111
INDEXED IN:
Scopus
WOS
CrossRef
:
20
IN MY:
ORCID
|
CIÊNCIAVITAE
15
TITLE:
Editorial for the Special Section of Measurement on the IMEKO TC-4 Benevento 2014 Symposium
AUTHORS:
Arpaia, P;
Ramos, PM
;
PUBLISHED:
2017
,
SOURCE:
MEASUREMENT,
VOLUME:
98
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
CIÊNCIAVITAE
16
TITLE:
A Comparative Analysis between Genetic Algorithms and Complex Nonlinear Least Squares on Electrical Impedance Characterization
AUTHORS:
Fernando M Janeiro
;
Pedro M Ramos
;
PUBLISHED:
2016
,
SOURCE:
IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
in
2016 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS
INDEXED IN:
WOS
IN MY:
ORCID
|
CIÊNCIAVITAE
17
TITLE:
A comparative analysis between genetic algorithms and complex nonlinear least squares on electrical impedance characterization
Full Text
AUTHORS:
Janeiro, FM
;
Ramos, PM
;
PUBLISHED:
2016
,
SOURCE:
2016 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016
in
Conference Record - IEEE Instrumentation and Measurement Technology Conference,
VOLUME:
2016-July
INDEXED IN:
Scopus
CrossRef
IN MY:
ORCID
|
CIÊNCIAVITAE
18
TITLE:
Cloud base height measurement system based on stereo vision with automatic calibration
Full Text
AUTHORS:
Janeiro, FM
;
Ramos, PM
; Carretas, F; Wagner, F;
PUBLISHED:
2016
,
SOURCE:
2016 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016
in
Conference Record - IEEE Instrumentation and Measurement Technology Conference,
VOLUME:
2016-July
INDEXED IN:
Scopus
CrossRef
IN MY:
ORCID
|
CIÊNCIAVITAE
19
TITLE:
Cloud Base Height Measurement System Based on Stereo Vision with Automatic Calibration
AUTHORS:
Fernando M Janeiro
; Filipe Carretas;
Pedro M Ramos
;
Frank Wagner
;
PUBLISHED:
2016
,
SOURCE:
IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
in
2016 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS
INDEXED IN:
WOS
IN MY:
ORCID
|
CIÊNCIAVITAE
20
TITLE:
Portable Embedded System for Contactless Measurement of Material Conductivity
AUTHORS:
Nuno Rodrigues
;
Luis Rosado
;
Pedro M Ramos
;
PUBLISHED:
2016
,
SOURCE:
21st IMEKO TC-4 International Symposium on Understanding the World through Electrical and Electronic Measurement / 19th International Workshop on ADC Modelling and Testing
in
PROCEEDINGS OF THE 21ST IMEKO TC-4 INTERNATIONAL SYMPOSIUM ON UNDERSTANDING THE WORLD THROUGH ELECTRICAL AND ELECTRONIC MEASUREMENT AND 19TH INTERNATIONAL WORKSHOP ON ADC MODELLING AND TESTING
INDEXED IN:
WOS
IN MY:
ORCID
|
CIÊNCIAVITAE
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