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Pedro Miguel Pinto Ramos
AuthID:
R-000-F0Z
Publications
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Document Type:
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Proceedings Paper (74)
Article (71)
Editorial Material (4)
Review (1)
Correction (1)
Book Chapter (1)
Article in Press (1)
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Year Asc
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IF Scopus Dsc
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Results:
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Confirmed Publications: 153
81
TITLE:
Improvement of Phase Difference Estimation Using Modified Ellipse Fit Method
Full Text
AUTHORS:
Zeeshan. A Awan
;
Pedro M Ramos
;
PUBLISHED:
2010
,
SOURCE:
International Instrumentation and Measurement Technology Conference (I2MTC)
in
2010 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE I2MTC 2010, PROCEEDINGS
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
CIÊNCIAVITAE
82
TITLE:
Low-cost mechanically steered millimeter-wave lens antenna system for indoor LANs
AUTHORS:
Fernandes, CA
;
Martins, RC
; Radil, T;
Ramos, PM
;
Lima, EB
;
Medeiros, CR
;
Jorge R. Costa
;
PUBLISHED:
2010
,
SOURCE:
2010 International Workshop on Antenna Technology: Small Antennas, Innovative Structures and Materials, iWAT2010
in
Final Program and Book of Abstracts - iWAT 2010: 2010 International Workshop on Antenna Technology: Small Antennas, Innovative Structures and Materials
INDEXED IN:
Scopus
CrossRef
:
2
IN MY:
ORCID
|
CIÊNCIAVITAE
83
TITLE:
Power Quality Detection and Classification Method for IEC 61000-4-30 Class A Instruments
Full Text
AUTHORS:
Tomas Radil
;
Pedro M Ramos
;
PUBLISHED:
2010
,
SOURCE:
International Instrumentation and Measurement Technology Conference (I2MTC)
in
2010 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE I2MTC 2010, PROCEEDINGS
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
CIÊNCIAVITAE
84
TITLE:
Sine-fitting algorithms implemented in 32-bit floating point systems
AUTHORS:
Ramos, PM
;
Radil, T
;
Janeiro, FM
;
PUBLISHED:
2010
,
SOURCE:
17th Symposium IMEKO TC4 - Measurement of Electrical Quantities, 15th International Workshop on ADC Modelling and Testing, and 3rd Symposium IMEKO TC19 - Environmental Measurements
in
17th Symposium IMEKO TC4 - Measurement of Electrical Quantities, 15th International Workshop on ADC Modelling and Testing, and 3rd Symposium IMEKO TC19 - Environmental Measurements
INDEXED IN:
Scopus
IN MY:
ORCID
|
CIÊNCIAVITAE
85
TITLE:
Uncertainty analysis of a cloud base height measurement system based on digital photography
AUTHORS:
Janeiro, FM
;
Wagner, F
;
Ramos, PM
;
Silva, AM
;
PUBLISHED:
2010
,
SOURCE:
17th Symposium IMEKO TC4 - Measurement of Electrical Quantities, 15th International Workshop on ADC Modelling and Testing, and 3rd Symposium IMEKO TC19 - Environmental Measurements
in
17th Symposium IMEKO TC4 - Measurement of Electrical Quantities, 15th International Workshop on ADC Modelling and Testing, and 3rd Symposium IMEKO TC19 - Environmental Measurements
INDEXED IN:
Scopus
IN MY:
ORCID
|
CIÊNCIAVITAE
86
TITLE:
Application of Genetic Algorithms for Estimation of Impedance Parameters of Two-Terminal Networks
Full Text
AUTHORS:
Fernando M Janeiro
;
Pedro M Ramos
;
PUBLISHED:
2009
,
SOURCE:
26th IEEE International Instrumentation and Measurement Technology Conference
in
I2MTC: 2009 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-3
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
CIÊNCIAVITAE
87
TITLE:
CLOUD BASE HEIGHT ESTIMATION USING A LOW-COST DIGITAL CAMERA
AUTHORS:
Fernando M Janeiro
;
Frank Wagner
;
Pedro M Ramos
;
Silva, AM
;
PUBLISHED:
2009
,
SOURCE:
19th IMEKO World Congress
in
XIX IMEKO WORLD CONGRESS: FUNDAMENTAL AND APPLIED METROLOGY, PROCEEDINGS,
VOLUME:
3
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
|
CIÊNCIAVITAE
88
TITLE:
Comparison of frequency estimation algorithms for power quality assessment
Full Text
AUTHORS:
Pedro M Ramos
;
Cruz C Serra
;
PUBLISHED:
2009
,
SOURCE:
MEASUREMENT,
VOLUME:
42,
ISSUE:
9
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
CIÊNCIAVITAE
89
TITLE:
Comparison of impedance measurements in a DSP using ellipse-fit and seven-parameter sine-fit algorithms
Full Text
AUTHORS:
Pedro M Ramos
;
Fernando M Janeiro
;
Tomas Radil
;
PUBLISHED:
2009
,
SOURCE:
MEASUREMENT,
VOLUME:
42,
ISSUE:
9
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
CIÊNCIAVITAE
90
TITLE:
Frequency and time—frequency domain analysis tools in measurement
AUTHORS:
Ramos, PM
;
Martins, RC
; Rapuano, S; Daponte, P;
PUBLISHED:
2009
,
SOURCE:
Modeling and Simulation in Science, Engineering and Technology,
ISSUE:
9780817645922
INDEXED IN:
Scopus
CrossRef
IN MY:
ORCID
|
CIÊNCIAVITAE
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