Ana Sofia Figueira Ramos


AuthID: R-000-1GJ

Confirmed Publications: 42



31
TITLE: Mechanical characterisation of gamma-TiAl thin films obtained by two different sputtering routes  Full Text
AUTHORS: Vieira, MT ; Trindade, B ; Ramos, AS ; Fernandes, JV ; Vieira, Manuel ;
PUBLISHED: 2002, SOURCE: 5th International Conference on Structural and Functional Intermetallics in MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, VOLUME: 329
INDEXED IN: Scopus WOS CrossRef: 13
IN MY: ORCID | ResearcherID
32
TITLE: Microstructural characterisation of y-TiAl joints
AUTHORS: Guedes, A; Pinto, AMP; Vieira, Manuel ; Viana, Filomena ; Ramos, AS ; Vieira, MT ;
PUBLISHED: 2002, SOURCE: 1st International Materials Symposium (Materials 2001) in ADVANCED MATERIALS FORUM I, VOLUME: 230-2
INDEXED IN: Scopus WOS CrossRef: 5
IN MY: ORCID | ResearcherID
33
TITLE: On the evaluation of the ductility of thin films  Full Text
AUTHORS: Antunes, JM ; Menezes, LF ; Vieira, Manuel ; Fernandes, JV ; Trindade, B ; Ramos, AS ; Vieira, MT ;
PUBLISHED: 2002, SOURCE: MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, VOLUME: 337, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef: 4
IN MY: ORCID | ResearcherID
34
TITLE: Oxidation behaviour of (TiAl)-based intermetallics doped with silver
AUTHORS: Ramos, AS ; Vieira, MT ; Louro, C ; Cavaleiro, A ;
PUBLISHED: 2002, SOURCE: 1st International Materials Symposium (Materials 2001) in ADVANCED MATERIALS FORUM I, VOLUME: 230-2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
35
TITLE: An approach using thin films as a predictive way to produce new bulk materials  Full Text
AUTHORS: Vieira, MT ; Ramos, AS ; Trindade, B ; Fernandes, JV ; Vieira, Manuel ;
PUBLISHED: 2000, SOURCE: 2nd Asian-European International Conference on Plasma Surface Engineering (AEPSE'99) in SURFACE & COATINGS TECHNOLOGY, VOLUME: 131, ISSUE: 1-3
INDEXED IN: Scopus WOS CrossRef: 2
IN MY: ORCID | ResearcherID
36
TITLE: Characterisation of modified sputtered (TiAl)-based intermetallic materials doped with silver and chromium
AUTHORS: Coelho, C; Ramos, AS ; Trindade, B ; Vieira, MT ; Fernandes, JV ; Vieira, Manuel ;
PUBLISHED: 2000, SOURCE: International Conference on Development in Light Metals in DEVELOPMENT IN LIGHT METALS: SCIENCE, TECHNOLOGY AND APPLICATION, VOLUME: 188
INDEXED IN: Scopus WOS CrossRef: 3
IN MY: ORCID | ResearcherID
37
TITLE: Mechanical characterisation of TiN/ZrN multi-layered coatings  Full Text
AUTHORS: Tavares, CJ ; Rebouta, L ; Andritschky, M ; Ramos, S ;
PUBLISHED: 1999, SOURCE: Proceedings of the 1997 Advances in Materials and Processing Technologies, AMPT'97 in JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, VOLUME: 93
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
38
TITLE: Structure and properties of sputtered TiAl-M (M = Ag, Cr) thin films  Full Text
AUTHORS: Coelho, C; Ramos, AS ; Trindade, B ; Vieira, MT ; Fernandes, JV ; Vieira, Manuel ;
PUBLISHED: 1999, SOURCE: 26th International Conference on Metallurgical Coating and Thin Films in SURFACE & COATINGS TECHNOLOGY, VOLUME: 120
INDEXED IN: Scopus WOS CrossRef: 15
IN MY: ORCID | ResearcherID
39
TITLE: The influence of ductile interlayers on the mechanical performance of tungsten nitride coatings  Full Text
AUTHORS: Vieira, MT ; Ramos, AS ;
PUBLISHED: 1999, SOURCE: Proceedings of the 1997 Advances in Materials and Processing Technologies, AMPT'97 in JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, VOLUME: 93
INDEXED IN: Scopus WOS CrossRef: 20
IN MY: ORCID | ResearcherID
40
TITLE: The influence of silver on the structure and mechanical properties of (TiAl)-based intermetallics  Full Text
AUTHORS: Vieira, MT ; Trindade, B ; Ramos, AS ; Fernandes, JV; Vieira, Manuel ;
PUBLISHED: 1999, SOURCE: 14th International Vacuum Congress/10th International Conference on Solid Surfaces/5th International Conference on Nanometre-Scale Science and Technology/10th International Conference on Quantitative Surface Analysis in THIN SOLID FILMS, VOLUME: 343, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef: 8
IN MY: ORCID | ResearcherID
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