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Vasco Manuel Pinto Teixeira
AuthID:
R-000-HE5
Publications
Confirmed
To Validate
Document Source:
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Document Type:
All Document Types
Article (95)
Proceedings Paper (17)
Editorial Material (3)
Correction (1)
Book Chapter (1)
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Order:
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Year Asc
Cit. WOS Dsc
IF WOS Dsc
Cit. Scopus Dsc
IF Scopus Dsc
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Results:
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Confirmed Publications: 117
91
TITLE:
Gas-sensitive response of SnO2 thin-film sensors produced by reactive DC magnetron sputtering
AUTHORS:
Correia Pires, JM;
Almeida, JB
;
Teixeira, V
;
PUBLISHED:
2002
,
SOURCE:
1st International Materials Symposium (Materials 2001)
in
ADVANCED MATERIALS FORUM I,
VOLUME:
230-2
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
|
ResearcherID
92
TITLE:
Influence of elastic properties of substrate and coating on the residual stress distribution of FGM coatings
AUTHORS:
Teixeira, V
;
PUBLISHED:
2002
,
SOURCE:
1st International Materials Symposium (Materials 2001)
in
ADVANCED MATERIALS FORUM I,
VOLUME:
230-2
INDEXED IN:
Scopus
WOS
CrossRef
:
2
IN MY:
ORCID
93
TITLE:
Microstructure study of indium tin oxide thin films by optical methods
Full Text
AUTHORS:
Cui, HN
;
Teixeira, V
;
Monteiro, A
;
PUBLISHED:
2002
,
SOURCE:
7th European Vacuum Conference (EVC-7)/3rd European Topical Conference on Hard Coatings (ETCHC-3)
in
VACUUM,
VOLUME:
67,
ISSUE:
3-4
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
94
TITLE:
Microwave plasma chemical vapour deposition diamond nucleation on ferrous substrates with Ti and Cr interlayers
Full Text
AUTHORS:
Silva, FJG
;
Baptista, APM
;
Pereira, E
;
Teixeira, V
;
Fan, QH
;
Fernandes, AJS
;
Costa, FM
;
PUBLISHED:
2002
,
SOURCE:
DIAMOND AND RELATED MATERIALS,
VOLUME:
11,
ISSUE:
9
INDEXED IN:
Scopus
WOS
CrossRef
:
36
IN MY:
ORCID
|
ResearcherID
95
TITLE:
Residual stress and cracking in thin PVD coatings
Full Text
AUTHORS:
Teixeira, V
;
PUBLISHED:
2002
,
SOURCE:
4th Iberian Vacuum Meeting (IVM-4)
in
VACUUM,
VOLUME:
64,
ISSUE:
3-4
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
96
TITLE:
Structural and optical characterization of WO3 deposited on glass and ITO
Full Text
AUTHORS:
Monteiro, A
;
Costa, MF
;
Almeida, B
;
Teixeira, V
; Gago, J; Roman, E;
PUBLISHED:
2002
,
SOURCE:
4th Iberian Vacuum Meeting (IVM-4)
in
VACUUM,
VOLUME:
64,
ISSUE:
3-4
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
97
TITLE:
Study of ZrO2/Al2O3 multilayers
Full Text
AUTHORS:
Gao, PT;
Meng, LJ
;
dos Santos, MP
;
Teixeira, V
;
Andritschky, M
;
PUBLISHED:
2002
,
SOURCE:
4th Iberian Vacuum Meeting (IVM-4)
in
VACUUM,
VOLUME:
64,
ISSUE:
3-4
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
98
TITLE:
Determination of biaxial modulus of chemical vapor-deposited diamond films
Full Text
AUTHORS:
Fan, QH
;
Gracio, J
;
Pereira, E
;
Teixeirae, V
;
Tavares, CJ
;
PUBLISHED:
2001
,
SOURCE:
28th International Conference on Metallurgical Coatings and Thin Films
in
THIN SOLID FILMS,
VOLUME:
398
INDEXED IN:
Scopus
WOS
CrossRef
:
4
IN MY:
ORCID
99
TITLE:
Influence of sputtering pressure on the structure and properties of ZrO2 films prepared by rf reactive sputtering
Full Text
AUTHORS:
Gao, PT;
Meng, LJ
;
dos Santos, MP
;
Teixeira, V
;
Andritschky, M
;
PUBLISHED:
2001
,
SOURCE:
APPLIED SURFACE SCIENCE,
VOLUME:
173,
ISSUE:
1-2
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
100
TITLE:
Mechanical integrity in PVD coatings due to the presence of residual stresses
Full Text
AUTHORS:
Teixeira, V
;
PUBLISHED:
2001
,
SOURCE:
3rd International Conference on Coatings and Glass (ICCG)
in
THIN SOLID FILMS,
VOLUME:
392,
ISSUE:
2
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
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