Vasco Manuel Pinto Teixeira


AuthID: R-000-HE5

Confirmed Publications: 117



91
TITLE: Gas-sensitive response of SnO2 thin-film sensors produced by reactive DC magnetron sputtering
AUTHORS: Correia Pires, JM; Almeida, JB; Teixeira, V ;
PUBLISHED: 2002, SOURCE: 1st International Materials Symposium (Materials 2001) in ADVANCED MATERIALS FORUM I, VOLUME: 230-2
INDEXED IN: Scopus WOS
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92
TITLE: Influence of elastic properties of substrate and coating on the residual stress distribution of FGM coatings
AUTHORS: Teixeira, V ;
PUBLISHED: 2002, SOURCE: 1st International Materials Symposium (Materials 2001) in ADVANCED MATERIALS FORUM I, VOLUME: 230-2
INDEXED IN: Scopus WOS
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93
TITLE: Microstructure study of indium tin oxide thin films by optical methods  Full Text
AUTHORS: Cui, HN; Teixeira, V ; Monteiro, A;
PUBLISHED: 2002, SOURCE: 7th European Vacuum Conference (EVC-7)/3rd European Topical Conference on Hard Coatings (ETCHC-3) in VACUUM, VOLUME: 67, ISSUE: 3-4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
94
95
TITLE: Residual stress and cracking in thin PVD coatings  Full Text
AUTHORS: Teixeira, V ;
PUBLISHED: 2002, SOURCE: 4th Iberian Vacuum Meeting (IVM-4) in VACUUM, VOLUME: 64, ISSUE: 3-4
INDEXED IN: Scopus WOS CrossRef
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96
TITLE: Structural and optical characterization of WO3 deposited on glass and ITO  Full Text
AUTHORS: Monteiro, A; Costa, MF ; Almeida, B ; Teixeira, V ; Gago, J; Roman, E;
PUBLISHED: 2002, SOURCE: 4th Iberian Vacuum Meeting (IVM-4) in VACUUM, VOLUME: 64, ISSUE: 3-4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
97
TITLE: Study of ZrO2/Al2O3 multilayers  Full Text
AUTHORS: Gao, PT; Meng, LJ ; dos Santos, MP ; Teixeira, V ; Andritschky, M ;
PUBLISHED: 2002, SOURCE: 4th Iberian Vacuum Meeting (IVM-4) in VACUUM, VOLUME: 64, ISSUE: 3-4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
98
TITLE: Determination of biaxial modulus of chemical vapor-deposited diamond films  Full Text
AUTHORS: Fan, QH; Gracio, J ; Pereira, E; Teixeirae, V ; Tavares, CJ ;
PUBLISHED: 2001, SOURCE: 28th International Conference on Metallurgical Coatings and Thin Films in THIN SOLID FILMS, VOLUME: 398
INDEXED IN: Scopus WOS CrossRef: 4
IN MY: ORCID
99
TITLE: Influence of sputtering pressure on the structure and properties of ZrO2 films prepared by rf reactive sputtering  Full Text
AUTHORS: Gao, PT; Meng, LJ ; dos Santos, MP ; Teixeira, V ; Andritschky, M ;
PUBLISHED: 2001, SOURCE: APPLIED SURFACE SCIENCE, VOLUME: 173, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
100
TITLE: Mechanical integrity in PVD coatings due to the presence of residual stresses  Full Text
AUTHORS: Teixeira, V ;
PUBLISHED: 2001, SOURCE: 3rd International Conference on Coatings and Glass (ICCG) in THIN SOLID FILMS, VOLUME: 392, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
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Page 10 of 12. Total results: 117.

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