171
TITLE: Flaw location from perpendicular NDE ultrasonic transducers using the wavelet packet transform
AUTHORS: M.A Rodriguez-Hernandez; Ramos, A ; J.L San Emeterio; J.J Perez-Solano;
PUBLISHED: 2005, SOURCE: IEEE Ultrasonics Symposium, 2004
INDEXED IN: CrossRef: 3
172
TITLE: Flaw location from perpendicular NDE ultrasonic transducers using the wavelet packet transform
AUTHORS: Rodríguez Hernández, MA; Ramos, A ; San Emeterio, JL; Pérez Solano, JJ;
PUBLISHED: 2004, SOURCE: 2004 IEEE ULTRASONICS SYMPOSIUM, VOLS 1-3
INDEXED IN: WOS
173
TITLE: Influence of internal mechanical losses on the fundamental frequencies of thickness extensional piezoelectric resonators  Full Text
AUTHORS: San Emeterio, JL; Ramos, A ;
PUBLISHED: 2003, SOURCE: FERROELECTRICS, VOLUME: 293, ISSUE: 1
INDEXED IN: WOS CrossRef: 8
174
TITLE: The effect of cemented femoral stem cross-section geometry in total hip replacement
AUTHORS: Ramos, A ; Fonseca, F ; Simoes, JA;
PUBLISHED: 2003, SOURCE: 5th International Conference on Computer Simulations in Biomedicine in SIMULATIONS IN BIOMEDICINE V, VOLUME: 7
INDEXED IN: Scopus WOS
175
TITLE: The influence of finishing milling strategies on texture, roughness and dimensional deviations on the machining of complex surfaces  Full Text
AUTHORS: Ramos, AM ; Relvas, C ; Simoes, JA;
PUBLISHED: 2003, SOURCE: JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, VOLUME: 136, ISSUE: 1-3
INDEXED IN: Scopus WOS CrossRef: 39
176
TITLE: Ultrasonic system for remote non-destructive testing using mobile telephony  Full Text
AUTHORS: Rodríguez Hernández, MA; Ramos, A ; Sanz, PT; San Emeterio, JL; Zaplana, D;
PUBLISHED: 2003, SOURCE: NDT & E INTERNATIONAL, VOLUME: 36, ISSUE: 2
INDEXED IN: WOS CrossRef: 3
178
TITLE: Influence of thresholding procedures in ultrasonic grain noise reduction using wavelets  Full Text
AUTHORS: Lázaro, JC; San Emeterio, JL; Ramos, A ; Fernández Marrón, JL;
PUBLISHED: 2002, SOURCE: ULTRASONICS, VOLUME: 40, ISSUE: 1-8
INDEXED IN: WOS CrossRef: 50
Page 18 of 18. Total results: 178.