António Manuel Cruz Serra


AuthID: R-000-28E

Confirmed Publications: 125



101
TITLE: Variance of the cumulative histogram of ADCs due to frequency errors
AUTHORS: Alegria, FC ; Serra, AC ;
PUBLISHED: 2001, SOURCE: 18th IEEE Instrumentation and Measurement Technology Conference (IMTC/2001) in IMTC/2001: PROCEEDINGS OF THE 18TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-3: REDISCOVERING MEASUREMENT IN THE AGE OF INFORMATICS, VOLUME: 3
INDEXED IN: Scopus WOS
IN MY: ORCID
102
TITLE: A new measurement method for the static test of ADCs  Full Text
AUTHORS: Serra, AC ;
PUBLISHED: 2000, SOURCE: COMPUTER STANDARDS & INTERFACES, VOLUME: 22, ISSUE: 2
INDEXED IN: Scopus WOS
IN MY: ORCID
103
TITLE: ADC characterization by using the histogram test stimulated by Gaussian noise - Theory and experimental results  Full Text
AUTHORS: Martins, RC ; Serra, AC ;
PUBLISHED: 2000, SOURCE: MEASUREMENT, VOLUME: 27, ISSUE: 4
INDEXED IN: Scopus WOS
IN MY: ORCID
104
TITLE: Automatic calibration of analog and digital measuring instruments using computer vision
AUTHORS: Alegria, FC ; Serra, AC ;
PUBLISHED: 2000, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 49, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
105
TITLE: Computer vision applied to the automatic calibration of measuring instruments  Full Text
AUTHORS: Alegria, FC ; Serra, AC ;
PUBLISHED: 2000, SOURCE: MEASUREMENT, VOLUME: 28, ISSUE: 3
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
106
TITLE: Influence of frequency errors in the variance of the cumulative histogram
AUTHORS: Alegria, FC ; Serra, AC ;
PUBLISHED: 2000, SOURCE: Conference on Precision Electromagnetic Measurements (CPEM 2000) in 2000 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST
INDEXED IN: Scopus WOS
IN MY: ORCID
107
TITLE: New measurement procedure for the static test of ADCs
AUTHORS: Serra, AC ;
PUBLISHED: 2000, SOURCE: 17th IEEE Instrumentation and Measurement Technology Conference in IMTC/2000: PROCEEDINGS OF THE 17TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE: SMART CONNECTIVITY: INTEGRATING MEASUREMENT AND CONTROL, VOLUME: 2
INDEXED IN: Scopus WOS
IN MY: ORCID
108
TITLE: Automated ADC characterization using the histogram test stimulated by Gaussian noise
AUTHORS: Martins, RC ; Serra, AMD ;
PUBLISHED: 1999, SOURCE: 1998 Conference on Precision Electromagnetic Measurements (CPEM 98) in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 48, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
109
TITLE: Dithered ADC systems in the presence of hysteresis errors  Full Text
AUTHORS: Pereira, JMD; Serra, AC ; Girao, PS;
PUBLISHED: 1999, SOURCE: 16th IEEE Instrumentation and Measurement Technology Conference in IMTC/99: PROCEEDINGS OF THE 16TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS. 1-3, VOLUME: 3
INDEXED IN: Scopus WOS
IN MY: ORCID
110
TITLE: Automated ADC characterisation using the histogram test stimulated by Gaussian noise
AUTHORS: Martins, RC ; Serra, AMC ;
PUBLISHED: 1998, SOURCE: 1998 Conference on Precision Electromagnetic Measurements (CPEM 98) in 1998 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST
INDEXED IN: Scopus WOS
Page 11 of 13. Total results: 125.

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