António Manuel Cruz Serra


AuthID: R-000-28E

Confirmed Publications: 125



61
TITLE: Uncertainty of the estimates of sine wave fitting of digital data in the presence of additive noise  Full Text
AUTHORS: Alegria, FC ; Serra, AC ;
PUBLISHED: 2006, SOURCE: 23rd IEEE Instrumentation and Measurement Technology Conference in 2006 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS, VOLS 1-5
INDEXED IN: WOS CrossRef
62
TITLE: A methodology for extracting unknown integrated circuit process parameters
AUTHORS: Quaresma, HJ; Santos, PM ; Serra, AC ; Sicard, E;
PUBLISHED: 2005, SOURCE: 12th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2005 in Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems
INDEXED IN: Scopus CrossRef
IN MY: ORCID
63
TITLE: Combined spectral and histogram analysis for fast ADC testing
AUTHORS: Serra, AC ; da Silva, MF; Ramos, PM ; Martins, RC ; Michaeli, L; Saliga, J;
PUBLISHED: 2005, SOURCE: 21st IEEE Instrumentation and Measurement Technology Conference in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 54, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
64
TITLE: DSP based portable impedance measurement instrument using sine-fitting algorithms
AUTHORS: Radil, T; Ramos, PM ; Cruz Serra, A ;
PUBLISHED: 2005, SOURCE: IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2
INDEXED IN: Scopus
IN MY: ORCID
65
TITLE: Effective ADC linearity testing using sinewaves
AUTHORS: Alegria, FAC ; Moschitta, A; Carbone, P; Serra, AMDC ; Petri, D;
PUBLISHED: 2005, SOURCE: IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, VOLUME: 52, ISSUE: 7
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
66
TITLE: Error correction technique for dynamic impedance measurement
AUTHORS: Quaresma, HJ; Silva, AP; Serra, AMC ;
PUBLISHED: 2005, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 54, ISSUE: 3
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
67
TITLE: Overdrive in the ramp histogram test of ADCs
AUTHORS: Alegria, FAC ; Serra, AMD ;
PUBLISHED: 2005, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 54, ISSUE: 6
INDEXED IN: Scopus WOS
IN MY: ORCID
68
TITLE: Precision of ADC gain and offset error estimation with the standard histogram test
AUTHORS: Alegria, FC; Serra, AC ;
PUBLISHED: 2005, SOURCE: IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
INDEXED IN: Scopus
IN MY: ORCID
69
TITLE: Uncertainty of ADC random noise estimates obtained with the IEEE 1057 standard test
AUTHORS: Alegria, FAC ; Serra, AMD ;
PUBLISHED: 2005, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 54, ISSUE: 1
INDEXED IN: Scopus WOS
IN MY: ORCID
70
TITLE: A new four parameter sine fitting technique  Full Text
AUTHORS: da Silva, MF; Ramos, PM ; Serra, AC ;
PUBLISHED: 2004, SOURCE: 7th Workshop on ADC Modelling and Testing in MEASUREMENT, VOLUME: 35, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
Page 7 of 13. Total results: 125.

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