António Manuel Cruz Serra


AuthID: R-000-28E

Confirmed Publications: 125



71
TITLE: An FFT-based method to evaluate and compensate gain and offset errors of interleaved ADC systems
AUTHORS: Pereira, JMD; Girao, PMBS; Serra, AMC ;
PUBLISHED: 2004, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 53, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
72
TITLE: Analog-to-digital converter testing - new proposals  Full Text
AUTHORS: Serra, AC ; Alegria, F ; Martins, R ; da Silva, MF;
PUBLISHED: 2004, SOURCE: 4th International Conference on Advanced A/D and D/A Conversion Techniques/7th European Workshop on ADC Modelling and Testing in COMPUTER STANDARDS & INTERFACES, VOLUME: 26, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
73
TITLE: Automated methodology for modeling and measuring memoryless nonlinearities from the stochastic properties of a signal
AUTHORS: Martins, RC ; Serra, AC ;
PUBLISHED: 2004, SOURCE: 7th Africon Conference in Africa in 2004 IEEE AFRICON: 7TH AFRICON CONFERENCE IN AFRICA, VOLS 1 AND 2: TECHNOLOGY INNOVATION, VOLUME: 1
INDEXED IN: Scopus WOS
IN MY: ORCID
74
TITLE: Error in the estimation of transition voltages with the standard histogram test of ADCs  Full Text
AUTHORS: Alegria, FC ; Serra, AC ;
PUBLISHED: 2004, SOURCE: MEASUREMENT, VOLUME: 35, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
75
TITLE: Fast ADC testing by spectral and histogram analysis
AUTHORS: Serra, AC ; Da Silva, MF; Ramos, P ; Michaeli, L; Saliga, J;
PUBLISHED: 2004, SOURCE: Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference, IMTC/04 in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2
INDEXED IN: Scopus
IN MY: ORCID
76
TITLE: Least-squares fitting algorithms applied to periodic signals  Full Text
AUTHORS: Da Silva, MF; Ramos, PM ; Martins, RC ; Serra, AC ;
PUBLISHED: 2004, SOURCE: Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference, IMTC/04 in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 3
INDEXED IN: Scopus CrossRef
IN MY: ORCID
77
TITLE: Low frequency impedance measurement using sine-fitting  Full Text
AUTHORS: Ramos, PM ; da Silva, MF; Serra, AC ;
PUBLISHED: 2004, SOURCE: MEASUREMENT, VOLUME: 35, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
78
TITLE: Overdrive in the standard histogram test of ADCs  Full Text
AUTHORS: Alegria, FC ; Serra, AC ;
PUBLISHED: 2004, SOURCE: MEASUREMENT, VOLUME: 35, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
79
TITLE: Performance of data acquisition systems from the user's point of view
AUTHORS: Alegria, F ; Girao, P; Haasz, V; Serra, A ;
PUBLISHED: 2004, SOURCE: 20th IEEE Instrumentation and Measurement Technology Conference in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 53, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
80
TITLE: Phase-plane characterization of analog-to-digital converters
AUTHORS: Monteiro, CL; Arpaia, P; Serra, AC ;
PUBLISHED: 2004, SOURCE: Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference, IMTC/04 in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
INDEXED IN: Scopus
IN MY: ORCID
Page 8 of 13. Total results: 125.

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