Nenad Bundaleski


AuthID: R-000-WDR

Confirmed Publications: 153



91
TITLE: Ab initio potential for the He-Ag(110) interaction investigated using grazing-incidence fast-atom diffraction
AUTHORS: Rios Rubiano, CAR; Bocan, GA; Gravielle, MS; Bundaleski, N ; Khemliche, H; Roncin, P;
PUBLISHED: 2013, SOURCE: PHYSICAL REVIEW A, VOLUME: 87, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | CIÊNCIAVITAE
92
TITLE: Catalytic applications of a versatile magnetically separable Fe-Mo (Nanocat-Fe-Mo) nanocatalyst  Full Text
AUTHORS: Gawande, MB; Branco, PS ; Nogueira, ID; Ghumman, CAA; Bundaleski, N ; Santos, A; Teodoro, OMND ; Luque, R;
PUBLISHED: 2013, SOURCE: GREEN CHEMISTRY, VOLUME: 15, ISSUE: 3
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | CIÊNCIAVITAE
93
94
95
TITLE: Experimental investigation of the influence of electron incidence angle on the Total Electron Emission Yield of silver
AUTHORS: Gineste, T; Belhaj, M; Bundaleski, N ; Teodoro, OMND ; Pons, C; Puech, J; Balcon, N;
PUBLISHED: 2013, SOURCE: 14th IEEE International Vacuum Electronics Conference, IVEC 2013 in 14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings
INDEXED IN: Scopus CrossRef
IN MY: ORCID | CIÊNCIAVITAE
96
TITLE: Experimental investigation of the Influence of Electron Incidence Angle on the Total Electron Emission Yield of Silver
AUTHORS: Gineste, T; Belhaj, M; Bundaleski, N ; Teodoro, OMND; Pons, C; Puech, J; Balcon, N;
PUBLISHED: 2013, SOURCE: 14th IEEE International Vacuum Electronics Conference (IVEC) in 2013 IEEE 14TH INTERNATIONAL VACUUM ELECTRONICS CONFERENCE (IVEC)
INDEXED IN: WOS
IN MY: ORCID | CIÊNCIAVITAE
97
98
TITLE: Influence of the incident angle on energy dependence of a secondary electron emission yield
AUTHORS: Bundaleski, N ; Belhaj, M; Gineste, T; Teodoro, OMND ;
PUBLISHED: 2013, SOURCE: 14th IEEE International Vacuum Electronics Conference, IVEC 2013 in 14th IEEE International Vacuum Electronics Conference, IVEC 2013 - Proceedings
INDEXED IN: Scopus CrossRef: 2
IN MY: ORCID | CIÊNCIAVITAE
99
TITLE: Influence of the Incident Angle on Energy Dependence of a Secondary Electron Emission Yield
AUTHORS: Bundaleski, N ; Belhaj, M; Gineste, T; Teodoro, MND;
PUBLISHED: 2013, SOURCE: 14th IEEE International Vacuum Electronics Conference (IVEC) in 2013 IEEE 14TH INTERNATIONAL VACUUM ELECTRONICS CONFERENCE (IVEC)
INDEXED IN: WOS
IN MY: ORCID | CIÊNCIAVITAE
100
TITLE: Influence of the patch field on work function measurements based on the secondary electron emission  Full Text
AUTHORS: Bundaleski, N ; Trigueiro, J; Silva, AG ; Moutinho, AMC ; Teodoro, OMND ;
PUBLISHED: 2013, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 113, ISSUE: 18
INDEXED IN: Scopus WOS CrossRef: 13
IN MY: ORCID | CIÊNCIAVITAE
Page 10 of 16. Total results: 153.

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