581
TITLE: Combination of IBA techniques for composition analysis of GaInAsSb films
AUTHORS: Corregidor, V; Chaves, PC ; Miguel A. Reis ; Pascual Izarra, C; Alves, E ; Barradas, NP ;
PUBLISHED: 2006, SOURCE: 3rd International Materials Symposium/12th Meeting of the Sociedad-Portuguesa-da-Materials (Materials 2005/SPM) in ADVANCED MATERIALS FORUM III, PTS 1 AND 2, VOLUME: 514-516, ISSUE: PART 2
INDEXED IN: Scopus WOS CrossRef: 5
582
TITLE: Compositional and structural changes in ZrOxNy films depending on growth condition  Full Text
AUTHORS: Carvalho, P; Fernandes, AC; Rebouta, L ; Vaz, F ; Cunha, L ; Kreissig, U; Barradas, NP ; Ramos, AR ; Alves, E ;
PUBLISHED: 2006, SOURCE: 17th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 249, ISSUE: 1-2 SPEC. ISS.
INDEXED IN: Scopus WOS CrossRef
583
TITLE: Damage behaviour of GaAs/AlAs multilayer structures  Full Text
AUTHORS: Magalhães, S; Fonseca, A; Franco, N; N.P Barradas; Sobolev, N; Hey, R; Grahn, H; Alves, E ;
PUBLISHED: 2006, SOURCE: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, VOLUME: 249, ISSUE: 1-2
INDEXED IN: CrossRef
584
TITLE: Damage behaviour of GaAs/AlAs multilayer structures  Full Text
AUTHORS: Magalhaes, S; Fonseca, A; Franco, N; Barradas, NP ; Sobolev, N; Hey, R; Grahn, H; Alves, E ;
PUBLISHED: 2006, SOURCE: 17th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 249, ISSUE: 1-2 SPEC. ISS.
INDEXED IN: Scopus WOS
585
TITLE: Defect production in neutron irradiated GaN  Full Text
AUTHORS: Marques, JG ; Lorenz, K ; Franco, N; Alves, E ;
PUBLISHED: 2006, SOURCE: 17th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 249, ISSUE: 1-2 SPEC. ISS.
INDEXED IN: Scopus WOS CrossRef
586
TITLE: Depth profiling of ion-implanted AlInN using time-of-flight secondary ion mass spectrometry and cathodoluminescence  Full Text
AUTHORS: Martin, RW; Rading, D; Kersting, R; Tallarek, E; Nogales, E; Amabile, D; Wang, K; Katchkanov, V; Trager Cowan, C; O'Donnell, KP; Watson, IM; Matias, V; Vantomme, A; Lorenz, K ; Alves, E ;
PUBLISHED: 2006, SOURCE: 6th International Conference on Nitride Semiconductors (ICNS-6) in Physica Status Solidi C - Current Topics in Solid State Physics, Vol 3, No 6, VOLUME: 3, ISSUE: 6
INDEXED IN: Scopus WOS CrossRef
588
TITLE: Effect of annealing temperature on luminescence in Eu implanted GaN  Full Text
AUTHORS: Bodiou, L; Oussif, A; Braud, A; Doualan, JL; Moncorge, R; Lorenz, K ; Alves, E ;
PUBLISHED: 2006, SOURCE: Meeting of the European-Materials-Research-Society in OPTICAL MATERIALS, VOLUME: 28, ISSUE: 6-7
INDEXED IN: Scopus WOS CrossRef
589
TITLE: Effect of the matrix on the 1.5 mu m photoluminescence of Er-doped silicon quantum dots
AUTHORS: Cerqueira, MF ; Stepikhova, M; Losurdo, M; Monteiro, T ; Soares, MJ ; Peres, M; Neves, A ; Alves, E ;
PUBLISHED: 2006, SOURCE: 3rd International Materials Symposium/12th Meeting of the Sociedad-Portuguesa-da-Materials (Materials 2005/SPM) in ADVANCED MATERIALS FORUM III, PTS 1 AND 2, VOLUME: 514-516, ISSUE: PART 2
INDEXED IN: Scopus WOS
590
TITLE: Failure mechanism of AlN nanocaps used to protect rare earth-implanted GaN during high temperature annealing  Full Text
AUTHORS: Nogales, E; Martin, RW; O'Donnell, KP; Lorenz, K ; Alves, E ; Ruffenach, S; Briot, O;
PUBLISHED: 2006, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 88, ISSUE: 3
INDEXED IN: Scopus WOS CrossRef
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