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682

TITLE: Up conversion from visible to ultraviolet in bulk ZnO implanted with Tm ions Full Text
AUTHORS: Monteiro, T ; Neves, AJ ; Soares, MJ ; Carmo, MC; Peres, M; Alves, E ; Rita, E;
PUBLISHED: 2005, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 87, ISSUE: 19

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683

TITLE: XRD analysis of strained Ge-SiGe heterostructures on relaxed SiGe graded buffers grown by hybrid epitaxy on Si(001) substrates Full Text
AUTHORS: Franco, N; Barradas, NP ; Alves, E ; Vallera, AM; Morris, RJH; Mironov, OA; Parker, EHC;
PUBLISHED: 2005, SOURCE: Symposium on Materials Science and Device Issues for Future Si-Based Technologies held at the 2005 EMRS Meeting in MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, VOLUME: 124, ISSUE: SUPPL.

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684

TITLE: Amorphisation of GaN during processing with rare earth ion beams Full Text
AUTHORS: Lorenz, K ; Wahl, U ; Alves, E ; Wojtowicz, T; Ruterana, P; Ruffenach, S; Briot, O;
PUBLISHED: 2004, SOURCE: Meeting of the European-Materials-Research-Society in SUPERLATTICES AND MICROSTRUCTURES, VOLUME: 36, ISSUE: 4-6

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685

TITLE: Atomic environment and interfacial structural order of TiAlN/Mo multilayers Full Text
AUTHORS: Tavares, CJ ; Rebouta, L ; Riviere, JP; Girardeau, T; Goudeau, P; Alves, E ; Barradas, NP ;
PUBLISHED: 2004, SOURCE: SURFACE & COATINGS TECHNOLOGY, VOLUME: 187, ISSUE: 2-3

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686

TITLE: Characterisation of defects in rare earth implanted GaN by deep level transient spectroscopy Full Text
AUTHORS: Colder, A; Marie, P; Wojtowicz, T; Ruterana, P; Eimer, S; Mechin, L; Lorenz, K ; Wahl, U ; Alves, E ; Matias, V; Mamor, M;
PUBLISHED: 2004, SOURCE: Meeting of the European-Materials-Research-Society in SUPERLATTICES AND MICROSTRUCTURES, VOLUME: 36, ISSUE: 4-6

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687

TITLE: Characterization of FePt nanoparticles in FePt/C multilayers Full Text
AUTHORS: Barradas, NP ; Alves, E ; Babonneau, D;
PUBLISHED: 2004, SOURCE: 16th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 219, ISSUE: 1-4

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688

TITLE: Characterization of hard DC-sputtered Si-based TiN coatings: the effect of composition and ion bombardment Full Text
AUTHORS: Ribeiro, E; Rebouta, L ; Carvalho, S ; Vaz, F ; Fuentes, GG; Rodriguez, R; Zazpe, M; Alves, E ; Goudeau, P; Riviere, JP;
PUBLISHED: 2004, SOURCE: 31st International Conference on Metallurgical Coatings and Thin Films in SURFACE & COATINGS TECHNOLOGY, VOLUME: 188, ISSUE: 1-3 SPEC.ISS.

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689

TITLE: Comparative study of radiation damage in GaN and InGaN by 400 keV Au implantation Full Text
AUTHORS: Wendler, E; Wesch, W; Alves, E ; Kamarou, A;
PUBLISHED: 2004, SOURCE: 12th International Conference on Radiation Effects in Insulators in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 218, ISSUE: 1-4

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690

TITLE: Compositional profiles in silica-based sol-gel films doped with erbium and silver, by RBS and ERDA Full Text
AUTHORS: Marques, AC ; Almeida, RM ; Ramos, AR ; Alves, E ;
PUBLISHED: 2004, SOURCE: 12th International Workshop on Sol-Gel-Science and Technology (Sol-Gel 2003) in JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY, VOLUME: 31, ISSUE: 1-3

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