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Eduardo Jorge da Costa Alves
AuthID:
R-000-4EK
Publications
Confirmed
To Validate
Document Source:
All
Document Type:
All Document Types
Article (797)
Proceedings Paper (88)
Correction (8)
Editorial Material (4)
Erratum (3)
Review (2)
Note (1)
Book Chapter (1)
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Order:
Year Dsc
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Cit. WOS Dsc
IF WOS Dsc
Cit. Scopus Dsc
IF Scopus Dsc
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Results:
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Confirmed Publications: 904
801
TITLE:
Coherent amorphization of Ge/Si multilayers with ion beams
Full Text
AUTHORS:
Alves, E
; Sequeira, AD;
Franco, N
; da Silva, MF;
Soares, JC
;
Sobolev, NA
;
Carmo, MC
;
PUBLISHED:
2001
,
SOURCE:
E-MRS Spring Meeting on Materials Science with Ion Beams
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
178,
ISSUE:
1-4
INDEXED IN:
Scopus
WOS
CrossRef
:
2
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
802
TITLE:
Compositional dependence of the strain-free optical band gap in InxGa1-xN layers
Full Text
AUTHORS:
Pereira, S
;
Correia, MR
;
Monteiro, T
; Pereira, E;
Alves, E
; Sequeira, AD; Franco, N;
PUBLISHED:
2001
,
SOURCE:
APPLIED PHYSICS LETTERS,
VOLUME:
78,
ISSUE:
15
INDEXED IN:
Scopus
WOS
CrossRef
Handle
803
TITLE:
Compositional pulling effects in InxGa1-x/GaN layers: A combined depth-resolved cathodoluminescence and Rutherford backscattering/channeling study
AUTHORS:
Pereira, S
;
Correia, MR
;
Pereira, E
; O'Donnell, KP; Trager Cowan, C; Sweeney, F;
Alves, E
;
PUBLISHED:
2001
,
SOURCE:
PHYSICAL REVIEW B,
VOLUME:
64,
ISSUE:
20
INDEXED IN:
Scopus
WOS
CrossRef
:
128
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
804
TITLE:
Depth resolved studies of indium content and strain in InGaN layers
Full Text
AUTHORS:
Pereira, S
;
Correia, MR
;
Pereira, E
; O'Donnell, KP; Trager Cowan, C; Sweeney, F;
Alves, E
; Sequeira, AD;
Franco, N
;
Watson, IM
;
PUBLISHED:
2001
,
SOURCE:
4th International Conference on Nitride Semiconductors (ICNS-4)
in
PHYSICA STATUS SOLIDI B-BASIC RESEARCH,
VOLUME:
228,
ISSUE:
1
INDEXED IN:
Scopus
WOS
CrossRef
:
3
IN MY:
ResearcherID
805
TITLE:
Doping of GaN by ion implantation
AUTHORS:
Alves, EJ
; Liu, C; Da Silva, MF;
Soares, JC
;
Correia, R
;
Monteiro, T
;
PUBLISHED:
2001
,
SOURCE:
Microstructural Processes in Irradiated Materials-2000
in
Materials Research Society Symposium - Proceedings,
VOLUME:
650
INDEXED IN:
Scopus
IN MY:
ORCID
|
CIÊNCIAVITAE
806
TITLE:
Elastic properties of (Ti,Al,Si) N nanocomposite films
Full Text
AUTHORS:
Carvalho, S
;
Vaz, F
;
Rebouta, L
; Schneider, D;
Cavaleiro, A
;
Alves, E
;
PUBLISHED:
2001
,
SOURCE:
7th International Conference on Plasma Surface Engineering (PSE 2000)
in
SURFACE & COATINGS TECHNOLOGY,
VOLUME:
142
INDEXED IN:
Scopus
WOS
CrossRef
:
37
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
807
TITLE:
Fe ion implantation in GaN: Damage, annealing, and lattice site location
Full Text
AUTHORS:
Liu, C;
Alves, E
;
Sequeira, AD
;
Franco, N
;
da Silva, MF
;
Soares, JC
;
PUBLISHED:
2001
,
SOURCE:
JOURNAL OF APPLIED PHYSICS,
VOLUME:
90,
ISSUE:
1
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
808
TITLE:
Green and red emission in Ca implanted GaN samples
Full Text
AUTHORS:
Monteiro, T
; Boemare, C;
Soares, MJ
;
Alves, E
; Liu, C;
PUBLISHED:
2001
,
SOURCE:
21st International Conference on Defects in Semiconductors
in
PHYSICA B-CONDENSED MATTER,
VOLUME:
308
INDEXED IN:
Scopus
WOS
CrossRef
Handle
809
TITLE:
Green, red and infrared Er-related emission in implanted GaN : Er and GaN : Er,O samples
Full Text
AUTHORS:
Monteiro, T
; Soares, J;
Correia, MR
;
Alves, E
;
PUBLISHED:
2001
,
SOURCE:
JOURNAL OF APPLIED PHYSICS,
VOLUME:
89,
ISSUE:
11
INDEXED IN:
Scopus
WOS
CrossRef
Handle
810
TITLE:
Heavy ion implantation in GaN epilayers
Full Text
AUTHORS:
Alves, E
;
Marques, JG
; Da Silva, MF; Soares, JC; Bartels, J; Vianden, R;
PUBLISHED:
2001
,
SOURCE:
International Conference on Defects in Insulating Materials
in
RADIATION EFFECTS AND DEFECTS IN SOLIDS,
VOLUME:
156,
ISSUE:
1-4
INDEXED IN:
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
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