Eduardo Jorge da Costa Alves


AuthID: R-000-4EK

Confirmed Publications: 597



101
TITLE: Mechanisms of damage formation in Eu-implanted GaN probed by X-ray diffraction
AUTHORS: Lacroix, B; Leclerc, S; Declemy, A; Lorenz, K ; Alves, E ; Ruterana, P;
PUBLISHED: 2011, SOURCE: EPL, VOLUME: 96, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
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102
TITLE: Microstructural characterization of the ODS Eurofer 97 EU-batch  Full Text
AUTHORS: Mateus, R ; Carvalho, PA ; Nunes, D ; Alves, LC ; Franco, N; Correia, JB; Alves, E ;
PUBLISHED: 2011, SOURCE: 26th Symposium on Fusion Technology (SOFT) in FUSION ENGINEERING AND DESIGN, VOLUME: 86, ISSUE: 9-11
INDEXED IN: Scopus WOS CrossRef
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103
TITLE: Optical properties of AlNxOy thin films deposited by DC magnetron sputtering
AUTHORS: Borges, J; Alves, E ; Vaz, F ; Marques, L ;
PUBLISHED: 2011, SOURCE: International Conference on Applications of Optics and Photonics in INTERNATIONAL CONFERENCE ON APPLICATIONS OF OPTICS AND PHOTONICS, VOLUME: 8001
INDEXED IN: Scopus WOS
IN MY: ORCID | ResearcherID
104
TITLE: Optimization Of A Mass Spectrometry Process
AUTHORS: Jose Lopes ; Correa Alegria, FC ; Luis Redondo ; Barradas, NP ; Alves, E ; Jorge Rocha;
PUBLISHED: 2011, SOURCE: 21st International Conference on Application of Accelerators in Research and Industry (CAARI) in APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY: TWENTY-FIRST INTERNATIONAL CONFERENCE, VOLUME: 1336
INDEXED IN: Scopus WOS
IN MY: ORCID | ResearcherID
105
TITLE: Preparation and characterization of CrNxOy thin films: The effect of composition and structural features on the electrical behavior  Full Text
AUTHORS: Arvinte, R; Borges, J; Sousa, RE; Munteanu, D; Barradas, NP ; Alves, E ; Vaz, F ; Marques, L ;
PUBLISHED: 2011, SOURCE: APPLIED SURFACE SCIENCE, VOLUME: 257, ISSUE: 21
INDEXED IN: Scopus WOS CrossRef
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106
TITLE: Radiation damage formation and annealing in GaN and ZnO
AUTHORS: Lorenz, K ; Peres, M; Franco, N; Marques, JG ; Miranda, SMC; Magalhaes, S; Monteiro, T ; Wesch, W; Alves, E ; Wendler, E;
PUBLISHED: 2011, SOURCE: Conference on Oxide-based Materials and Devices II in OXIDE-BASED MATERIALS AND DEVICES II, VOLUME: 7940
INDEXED IN: Scopus WOS
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107
TITLE: Rapid thermal annealing of rare earth implanted ZnO epitaxial layers  Full Text
AUTHORS: Miranda, SMC; Peres, M; Monteiro, T ; Alves, E ; Sun, HD; Geruschke, T; Vianden, R; Lorenz, K ;
PUBLISHED: 2011, SOURCE: Spring Meeting of the European-Materials-Research-Society in OPTICAL MATERIALS, VOLUME: 33, ISSUE: 7
INDEXED IN: Scopus WOS CrossRef: 18
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108
TITLE: Resonant Raman scattering in ZnO:Mn and ZnO:Mn:Al thin films grown by RF sputtering  Full Text
AUTHORS: Cerqueira, MF ; Vasilevskiy, MI ; Oliveira, F; Rolo, AG ; Viseu, T ; Ayres de Campos, JA ; Alves, E ; Correia, R;
PUBLISHED: 2011, SOURCE: JOURNAL OF PHYSICS-CONDENSED MATTER, VOLUME: 23, ISSUE: 33
INDEXED IN: Scopus WOS CrossRef: 12
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109
TITLE: Stopping Power Of He, C And O In InN  Full Text
AUTHORS: Barradas, NP ; Alves, E ; Siketic, Z; Radovic, IB;
PUBLISHED: 2011, SOURCE: 21st International Conference on Application of Accelerators in Research and Industry (CAARI) in APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY: TWENTY-FIRST INTERNATIONAL CONFERENCE, VOLUME: 1336
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | ResearcherID
110
TITLE: Structural and optical properties of Ag:TiO2 nanocomposite films prepared by magnetron sputtering
AUTHORS: Adochite, RC; Torrell, M; Cunha, L ; Alves, E ; Barradas, NP ; Cavaleiro, A ; Riviere, JP; Eyidi, D; Vaz, F ;
PUBLISHED: 2011, SOURCE: OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS, VOLUME: 5, ISSUE: 1-2
INDEXED IN: Scopus WOS
IN MY: ORCID | ResearcherID
Page 11 of 60. Total results: 597.

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