831
TITLE: Transparent, conductive ZnO : Al thin film deposited on polymer substrates by RF magnetron sputtering  Full Text
AUTHORS: Fortunato, E ; Nunes, P; Marques, A; Costa, D; Aguas, H ; Ferreira, I ; Costa, MEV ; Godinho, MH ; Almeida, PL ; Borges, JP ; Martins, R ;
PUBLISHED: 2002, SOURCE: Spring Meeting of the European-Materials-Research-Society in SURFACE & COATINGS TECHNOLOGY, VOLUME: 151
INDEXED IN: Scopus WOS CrossRef: 47
832
TITLE: Application of amorphous silicon thin-film position-sensitive detector to optical rules  Full Text
AUTHORS: Martins, R ; Teodoro, P; Soares, F; Ferreira, I; Guimaraes, N; Fortunato, E ; Borges, J; Jose, G; Groth, A; Schultze, L; Berndt, D; Reichel, F; Stam, F;
PUBLISHED: 2001, SOURCE: ADVANCED ENGINEERING MATERIALS, VOLUME: 3, ISSUE: 3
INDEXED IN: WOS
833
TITLE: Characterization of zinc oxide thin films deposited by rf magnetron sputtering on Mylar substrates
AUTHORS: Fortunato, E ; Nunes, P; Marques, A; Costa, D; Aguas, H ; Ferreira, I ; Costa, MEV ; Martins, R ;
PUBLISHED: 2001, SOURCE: Transport and Microstructural Phenomena in Oxide Electronics in Materials Research Society Symposium - Proceedings, VOLUME: 666
INDEXED IN: Scopus
834
TITLE: Correlation between a-Si : H surface oxidation process and the performance of MIS structures  Full Text
AUTHORS: Aguas, H ; Nunes, Y ; Fortunato, E ; Gordo, P; Maneira, M; Martins, R ;
PUBLISHED: 2001, SOURCE: 3rd Symposium O on Thin Film Materials for Large Area Electronics of the E-MRS 2000 Spring Meeting in THIN SOLID FILMS, VOLUME: 383, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef
835
TITLE: Correlation between the carbon and hydrogen contents with the gas species and the plasma impedance of silicon carbide films produced by PECVD technique  Full Text
AUTHORS: Martins, R ; Silva, V; Aguas, H ; Cabrita, A; Ferreira, I ; Fortunato, E ;
PUBLISHED: 2001, SOURCE: Spring Meeting of the European-Materials-Research-Society in APPLIED SURFACE SCIENCE, VOLUME: 184, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
836
TITLE: Correlation between the microscopic and macroscopic characteristics of SnO2 thin film gas sensors  Full Text
AUTHORS: Lopes, A; Fortunato, E ; Nunes, P; Vilarinho, P ; Martins, R ;
PUBLISHED: 2001, SOURCE: Spring Meeting of the European-Materials-Research-Society in INTERNATIONAL JOURNAL OF INORGANIC MATERIALS, VOLUME: 3, ISSUE: 8
INDEXED IN: Scopus WOS CrossRef: 5
837
TITLE: Effect of deposition conditions upon gas sensitivity of zinc oxide thin films deposited by spray pyrolysis
AUTHORS: Nunes, P; Fortunato, E ; Vilarinho, P ; Martins, R ;
PUBLISHED: 2001, SOURCE: 6th International Conference on Polycrystalline Semiconductors in POLYCRYSTALLINE SEMICONDUCTORS IV MATERIALS, TECHNOLOGIES AND LARGE AREA ELECTRONICS, VOLUME: 80-81
INDEXED IN: Scopus WOS
838
TITLE: Effect of different dopants on the properties of ZnO thin films  Full Text
AUTHORS: Nunes, P; Fortunato, E ; Vilarinho, P ; Martins, R ;
PUBLISHED: 2001, SOURCE: Spring Meeting of the European-Materials-Research-Society in INTERNATIONAL JOURNAL OF INORGANIC MATERIALS, VOLUME: 3, ISSUE: 8
INDEXED IN: Scopus WOS CrossRef
839
TITLE: Fast and cheap method to qualitatively measure the thickness and uniformity of ZrO2 thin films  Full Text
AUTHORS: Aguas, H ; Marques, A; Martins, R ; Fortunato, E ;
PUBLISHED: 2001, SOURCE: Spring Meeting of the European-Materials-Research-Society in MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, VOLUME: 4, ISSUE: 1-3
INDEXED IN: Scopus WOS
840
TITLE: Fast and cheap method to qualitatively measure the thickness and uniformity of ZrO2 thin films  Full Text
AUTHORS: Hugo Águas; António Marques; Rodrigo Martins; Elvira Fortunato ;
PUBLISHED: 2001, SOURCE: Materials Science in Semiconductor Processing, VOLUME: 4, ISSUE: 1-3
INDEXED IN: CrossRef
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