Fernando Manuel Tim Tim Janeiro


AuthID: R-000-52M

Confirmed Publications: 82



31
TITLE: Performance comparison between complex non-linear least squares and genetic algorithms in impedance circuit parameter estimation
AUTHORS: Janeiro, FM ; Ramos, PM;
PUBLISHED: 2015, SOURCE: 21st IMEKO World Congress on Measurement in Research and Industry in XXI IMEKO World Congress "Measurement in Research and Industry"
INDEXED IN: Scopus
IN MY: ORCID | CIÊNCIAVITAE
32
TITLE: Advances in cloud base height and wind speed measurement through stereophotogrammetry with low cost consumer cameras  Full Text
AUTHORS: Fernando M Janeiro ; Filipe Carretas; Konrad Kandler; Frank Wagner; Pedro M Ramos ;
PUBLISHED: 2014, SOURCE: 20th World Congress of the International-Measurement-Confederation (IMEKO) - Metrology for Green Growth in MEASUREMENT, VOLUME: 51, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | CIÊNCIAVITAE
33
TITLE: Embedded Viscosity Measurement System using a Vibrating-Wire Sensor  Full Text
AUTHORS: Jose Santos; Fernando M Janeiro ; Pedro M Ramos ;
PUBLISHED: 2014, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2014 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) PROCEEDINGS
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | CIÊNCIAVITAE
34
35
36
TITLE: Measurement Time Optimization of Impedance Spectroscopy Techniques Applied to a Vibrating Wire Viscosity Sensor
AUTHORS: Santos, J; Janeiro, FM ; Ramos, PM;
PUBLISHED: 2014, SOURCE: 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014 in 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014
INDEXED IN: Scopus
IN MY: ORCID | CIÊNCIAVITAE
37
TITLE: RFID Chip Characterization through S-Parameter Measurements and Gene Expression Programming  Full Text
AUTHORS: Fernando M Janeiro ; Carlos A Fernandes ; Jorge R. Costa ; Pedro M Ramos ;
PUBLISHED: 2014, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2014 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) PROCEEDINGS
INDEXED IN: Scopus WOS CrossRef: 1
IN MY: ORCID | CIÊNCIAVITAE
38
TITLE: Ultra high frequency circuit identification through gene expression programming
AUTHORS: Janeiro, FM ; Jorge R. Costa ; Fernandes, CA ; Ramos, PM;
PUBLISHED: 2014, SOURCE: 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014 in 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014
INDEXED IN: Scopus
IN MY: ORCID | CIÊNCIAVITAE
39
TITLE: Defect Characterization With Eddy Current Testing Using Nonlinear-Regression Feature Extraction and Artificial Neural Networks
AUTHORS: Rosado, LS; Janeiro, FM ; Ramos, PM ; Piedade, M ;
PUBLISHED: 2013, SOURCE: 29th Annual IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 62, ISSUE: 5
INDEXED IN: Scopus WOS CrossRef Handle
IN MY: ORCID | CIÊNCIAVITAE
40
TITLE: Gene expression programming for automatic circuit model identification in impedance spectroscopy: Performance evaluation  Full Text
AUTHORS: Pedro M Ramos ; Fernando M Janeiro ;
PUBLISHED: 2013, SOURCE: IMEKO World Congress in MEASUREMENT, VOLUME: 46, ISSUE: 10
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID | CIÊNCIAVITAE
Page 4 of 9. Total results: 82.

footer slogan

Useful Links

Get Help

© 2026 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service