José Alberto Peixoto Machado da Silva


AuthID: R-000-7Z3

Confirmed Publications: 102



61
TITLE: A BIST Scheme for RF Power Amplifiers
AUTHORS: José M da Silva ; Pedro Mota; Gabriel Pinho;
PUBLISHED: 2006
INDEXED IN: Handle
62
TITLE: A low-power oscillation based LNA BIST scheme
AUTHORS: da Silva, JM ;
PUBLISHED: 2006, SOURCE: International Conference on Design and Test of Integrated Systems in Nanoscale Technology in IEEE DTIS: 2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology, Proceedings
INDEXED IN: Scopus WOS CrossRef: 7 Handle
IN MY: ORCID | CIÊNCIAVITAE
63
TITLE: A high level test processor and test program generator
AUTHORS: Francisco X Duarte; José C Alves; José M da Silva ; António Pinho; José S Matos;
PUBLISHED: 2005
INDEXED IN: Handle
64
TITLE: A processor for testing mixed-signal cores in System-on-Chip
AUTHORS: Duarte, F; da Silva, JM ; Alves, JC ; Pinho, GA; Matos, JS ;
PUBLISHED: 2005, SOURCE: 8th Euromicro Conference on Digital System Design in DSD 2005: 8th Euromicro Conference on Digital System Design, Proceedings, VOLUME: 2005
INDEXED IN: Scopus WOS DBLP CrossRef
IN MY: ORCID | DBLP | CIÊNCIAVITAE
65
TITLE: ADC Applications, Architectures and Terminology
AUTHORS: José Machado Silva ; Hélio Mendonça ;
PUBLISHED: 2005, SOURCE: The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters
INDEXED IN: CrossRef: 1
IN MY: ORCID | CIÊNCIAVITAE
66
TITLE: Comparative Study of ADC Sinewave Test Methods
AUTHORS: José Machado Silva ; Hélio Mendonça ; Sara Mazoleni;
PUBLISHED: 2005, SOURCE: The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters
INDEXED IN: CrossRef
IN MY: ORCID
67
TITLE: Design for embedded testing of an LNA
AUTHORS: José M da Silva ; António Pinho; José S Matos;
PUBLISHED: 2005
INDEXED IN: Handle
68
TITLE: Differential Gain and Phase Testing
AUTHORS: José Machado Silva ; Hélio Mendonça ;
PUBLISHED: 2005, SOURCE: The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters
INDEXED IN: CrossRef
IN MY: ORCID
69
TITLE: Low-Power In-Circuit testing of a LNA
AUTHORS: José M da Silva ;
PUBLISHED: 2005
INDEXED IN: Handle
70
TITLE: Computing ADC harmonic content from a reduced number of values  Full Text
AUTHORS: Mendonca, HS ; da Silva, JM ; Matos, JS ;
PUBLISHED: 2003, SOURCE: 20th IEEE Instrumentation and Measurement Technology Conference in IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2, VOLUME: 2
INDEXED IN: Scopus WOS CrossRef: 1
IN MY: ORCID | CIÊNCIAVITAE
Page 7 of 11. Total results: 102.

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