José Alberto Peixoto Machado da Silva


AuthID: R-000-7Z3

Confirmed Publications: 85



41
TITLE: Fault detection system for a stent-graft endoleakage monitor
AUTHORS: Oliveira, C; Da Silva, JM ;
PUBLISHED: 2012, SOURCE: 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012 in Proceedings of the 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012
INDEXED IN: Scopus CrossRef: 3
IN MY: ORCID
42
TITLE: Inductive coupling system for endovascular aneurysm repair monitoring
AUTHORS: Oliveira, C; Almeida, N; MacHado Da Silva, J ;
PUBLISHED: 2012, SOURCE: 9th International Conference on Wearable Micro and Nano Technologies for Personalized Health, pHealth 2012 in Studies in Health Technology and Informatics, VOLUME: 177
INDEXED IN: Scopus
IN MY: ORCID
43
TITLE: Signal integrity and interconnections test on technical fabrics
AUTHORS: Zambrano, A; Da Silva, JM ;
PUBLISHED: 2012, SOURCE: 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012 in Proceedings of the 2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop, IMS3TW 2012
INDEXED IN: Scopus CrossRef: 2
IN MY: ORCID
44
TITLE: A True Power Detector for RF PA Built-In Calibration and Testing  Full Text
AUTHORS: Pedro Fonseca da Mota; Jose Machado da Silva ;
PUBLISHED: 2011, SOURCE: Design, Automation and Test in Europe Conference (DATE) in 2011 DESIGN, AUTOMATION & TEST IN EUROPE (DATE)
INDEXED IN: Scopus WOS CrossRef: 3
IN MY: ORCID
45
TITLE: A comparison between voltage and true power based embedded measurements for RF testing
AUTHORS: Mota, P; Da Silva, JM ;
PUBLISHED: 2010, SOURCE: 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2010 in Proceedings of the 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop, IMS3TW 2010
INDEXED IN: Scopus CrossRef
IN MY: ORCID
46
TITLE: Estimation of RF PA Nonlinearities after Cross-correlating Current and Output Voltage  Full Text
AUTHORS: Pedro Fonseca Mota; Jose A M Machado da Silva ; Ricardo A Veiga;
PUBLISHED: 2010, SOURCE: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 26, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
47
TITLE: Evaluation of RF Pa nonlinearities based on cross-correlation between current and output voltage
AUTHORS: Mota, P; Da Silva, JM ; Veiga, R;
PUBLISHED: 2010, SOURCE: 5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2010 in 5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2010
INDEXED IN: Scopus CrossRef
IN MY: ORCID
48
TITLE: ESTIMATION OF RF PA NONLINEARITIES AFTER CROSS-CORRELATING POWER SUPPLY CURRENT AND OUTPUT VOLTAGE
AUTHORS: Ricardo Veiga; Pedro Mota; Jose Machado da Silva ;
PUBLISHED: 2009, SOURCE: IEEE 15th International Mixed-Signals, Sensors and Systems Test Workshop in 2009 IEEE 15TH INTERNATIONAL MIXED-SIGNALS, SENSORS, AND SYSTEMS TEST WORKSHOPS
INDEXED IN: Scopus WOS CrossRef: 1
IN MY: ORCID
49
TITLE: Influence of parasitic capacitances in modeling and analysis of advanced floating gate memory devices
AUTHORS: Moreira, A; Da Silva, JM ; Tao, G;
PUBLISHED: 2009, SOURCE: 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2009 in Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
INDEXED IN: Scopus CrossRef
IN MY: ORCID
50
TITLE: A pull-in based test mechanism for device diagnostic and process characterization  Full Text
AUTHORS: Rocha, LA ; Mol, L; Cretu, E; Wolffenbuttel, RF; MacHado Da Silva, J ;
PUBLISHED: 2008, SOURCE: VLSI Design, VOLUME: 2008
INDEXED IN: Scopus CrossRef: 10
IN MY: ORCID
Page 5 of 9. Total results: 85.

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