José Alberto Peixoto Machado da Silva


AuthID: R-000-7Z3

Confirmed Publications: 85



51
TITLE: An Adaptive Scheme for Estimating and Correcting RF Amplifiers' Non-linearities
AUTHORS: Pedro F Mota; Machado M da Silva ; Long, J;
PUBLISHED: 2008, SOURCE: IEEE Asia Pacific Conference on Circuits and Systems (APCCAS 2008) in 2008 IEEE ASIA PACIFIC CONFERENCE ON CIRCUITS AND SYSTEMS (APCCAS 2008), VOLS 1-4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
52
TITLE: Estimation of analogue-to-digital converter's signal-to-noise plus distortion ratio using the code histogram method  Full Text
AUTHORS: Mendonca, HS ; Machado M da Silva ; Matos, JS ;
PUBLISHED: 2008, SOURCE: IET SCIENCE MEASUREMENT & TECHNOLOGY, VOLUME: 2, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
53
TITLE: Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop  Full Text
AUTHORS: Bozena Kaminska; Marcelo Lubaszewski; José Machado da Silva ;
PUBLISHED: 2008, SOURCE: VLSI Design, VOLUME: 2008
INDEXED IN: CrossRef
IN MY: ORCID
54
TITLE: Proceedings - 2007 International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2007: Foreword
AUTHORS: Hamdioui, S; Orailoglu, A; Van Der Meijs, N; Da Silva, JM ;
PUBLISHED: 2007, SOURCE: 2007 International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2007 in Proceedings - 2007 International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2007
INDEXED IN: Scopus CrossRef
IN MY: ORCID
55
TITLE: A low-power oscillation based LNA BIST scheme
AUTHORS: Machado M da Silva ;
PUBLISHED: 2006, SOURCE: International Conference on Design and Test of Integrated Systems in Nanoscale Technology in IEEE DTIS: 2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology, Proceedings
INDEXED IN: Scopus WOS CrossRef: 7
IN MY: ORCID
56
TITLE: A processor for testing mixed-signal cores in System-on-Chip
AUTHORS: Duarte, F; da Silva, JM ; Alves, JC ; Pinho, GA; Matos, JS ;
PUBLISHED: 2005, SOURCE: 8th Euromicro Conference on Digital System Design in DSD 2005: 8th Euromicro Conference on Digital System Design, Proceedings, VOLUME: 2005
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
57
TITLE: ADC Applications, Architectures and Terminology
AUTHORS: José Machado Silva ; Hélio Mendonça ;
PUBLISHED: 2005, SOURCE: The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters
INDEXED IN: CrossRef: 1
IN MY: ORCID
58
TITLE: Comparative Study of ADC Sinewave Test Methods
AUTHORS: José Machado Silva ; Hélio Mendonça ; Sara Mazoleni;
PUBLISHED: 2005, SOURCE: The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters
INDEXED IN: CrossRef
IN MY: ORCID
59
TITLE: Differential Gain and Phase Testing
AUTHORS: José Machado Silva ; Hélio Mendonça ;
PUBLISHED: 2005, SOURCE: The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters
INDEXED IN: CrossRef
IN MY: ORCID
60
TITLE: Computing ADC harmonic content from a reduced number of values  Full Text
AUTHORS: Mendonca, HS ; da Silva, JM ; Matos, JS ;
PUBLISHED: 2003, SOURCE: 20th IEEE Instrumentation and Measurement Technology Conference in IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2, VOLUME: 2
INDEXED IN: Scopus WOS CrossRef: 1
IN MY: ORCID
Page 6 of 9. Total results: 85.

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