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Katharina Lorenz
AuthID:
R-000-90E
Publications
Confirmed
To Validate
Document Source:
All
Document Type:
All Document Types
Article (244)
Proceedings Paper (43)
Article in Press (13)
Review (6)
Correction (4)
Editorial Material (2)
Erratum (1)
Book Chapter (1)
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Order:
Year Dsc
Year Asc
Cit. WOS Dsc
IF WOS Dsc
Cit. Scopus Dsc
IF Scopus Dsc
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Title Dsc
Results:
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Confirmed Publications: 314
221
TITLE:
Optical and Structural Properties of an Eu Implanted Gallium Nitride Quantum Dots/Aluminium Nitride Superlattice
AUTHORS:
Peres, M;
Neves, AJ
;
Monteiro, T
; Magalhaes, S;
Franco, N
;
Lorenz, K
;
Alves, E
; Damilano, B; Massies, J; Dussaigne, A; Grandjean, N;
PUBLISHED:
2010
,
SOURCE:
2nd International Conference on Advanced Nano Materials
in
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY,
VOLUME:
10,
ISSUE:
4
INDEXED IN:
Scopus
WOS
CrossRef
Handle
IN MY:
ORCID
|
CIÊNCIAVITAE
222
TITLE:
Optical doping and damage formation in AlN by Eu implantation
Full Text
AUTHORS:
Lorenz, K
;
Alves, E
;
Gloux, F
;
Ruterana, P
;
Peres, M
;
Neves, AJ
;
Monteiro, T
;
PUBLISHED:
2010
,
SOURCE:
JOURNAL OF APPLIED PHYSICS,
VOLUME:
107,
ISSUE:
2
INDEXED IN:
Scopus
WOS
CrossRef
:
27
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
223
TITLE:
RE Implantation and Annealing of III-Nitrides
AUTHORS:
Katharina Lorenz
;
Eduardo Alves
;
Florence Gloux
;
Pierre Ruterana
;
PUBLISHED:
2010
,
SOURCE:
RARE EARTH DOPED III-NITRIDES FOR OPTOELECTRONIC AND SPINTRONIC APPLICATIONS,
VOLUME:
124
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
224
TITLE:
The Characterization of N Interstitials and Dangling Bond Point Defects on Ion-Implanted GaN Nanowires Studied by Photoluminescence and X-Ray Absorption Spectroscopy. Rapid Communications of the American Ceramic Society
Full Text
AUTHORS:
Kuo Hao Lee; Jau Wern Chiou; Jin Ming Chen; Jyh Fu Lee; Alain Braud;
Katharina Lorenz
;
Eduardo Alves
; In Gann Chen;
PUBLISHED:
2010
,
SOURCE:
JOURNAL OF THE AMERICAN CERAMIC SOCIETY,
VOLUME:
93,
ISSUE:
11
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
225
TITLE:
Thin film depth profiling using simultaneous particle backscattering and nuclear resonance profiling
Full Text
AUTHORS:
Barradas, NP
;
Mateus, R
;
Fonseca, M.
;
Miguel A. Reis
;
Lorenz, K
;
Vickridge, I
;
PUBLISHED:
2010
,
SOURCE:
19th International Conference on Ion Beam Analysis
in
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,
VOLUME:
268,
ISSUE:
11-12
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
226
TITLE:
Total reflectance and Raman studies in AlyInxGa1-x-yN epitaxial layers
Full Text
AUTHORS:
Margarida M Bola
;
Correia, MR
;
Pereira, S
; Gonzalez, JC;
Lorenz, K
;
Alves, E
;
Barradas, N
;
PUBLISHED:
2010
,
SOURCE:
Symposium on Group III Nitride Semiconductors held at the 2009 EMRS Spring Meeting
in
PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 7, NO 1,
VOLUME:
7,
ISSUE:
1
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
227
TITLE:
Alloy and lattice disorder in Hf implanted
Full Text
AUTHORS:
Thomas Geruschke
;
Katharina Lorenz
; Reiner Vianden;
PUBLISHED:
2009
,
SOURCE:
Physica B: Condensed Matter,
VOLUME:
404,
ISSUE:
23-24
INDEXED IN:
CrossRef
IN MY:
ORCID
|
CIÊNCIAVITAE
228
TITLE:
Alloy and lattice disorder in Hf implanted AlxGa1-xN (0 <= x <= 1)
Full Text
AUTHORS:
Thomas Geruschke;
Katharina Lorenz
; Reiner Vianden;
PUBLISHED:
2009
,
SOURCE:
25th International Conference on Defects in Semiconductors
in
PHYSICA B-CONDENSED MATTER,
VOLUME:
404,
ISSUE:
23-24
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
229
TITLE:
Breakdown of anomalous channeling with ion energy for accurate strain determination in GaN-based heterostructures
Full Text
AUTHORS:
Redondo Cubero, A
;
Lorenz, K
; Gago, R;
Franco, N
; Fernandez Garrido, S; Smulders, PJM; Munoz, E; Calleja, E;
Watson, IM
;
Alves, E
;
PUBLISHED:
2009
,
SOURCE:
APPLIED PHYSICS LETTERS,
VOLUME:
95,
ISSUE:
5
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
|
ResearcherID
|
CIÊNCIAVITAE
230
TITLE:
Breakdown of anomalous channeling with ion energy for accurate strain determination in GaN-based heterostructures
Full Text
AUTHORS:
Redondo-Cubero, A
;
Lorenz, K
; Gago, R;
Franco, N
; Fernández-Garrido, S; Smulders, PJM; Muñoz, E; Calleja, E; Watson, IM;
Alves, E
;
PUBLISHED:
2009
,
SOURCE:
Appl. Phys. Lett. - Applied Physics Letters,
VOLUME:
95,
ISSUE:
5
INDEXED IN:
CrossRef
IN MY:
ORCID
|
CIÊNCIAVITAE
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