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Katharina Lorenz
AuthID:
R-000-90E
Publications
Confirmed
To Validate
Document Source:
All
Document Type:
All Document Types
Article (236)
Proceedings Paper (42)
Review (6)
Article in Press (6)
Correction (4)
Editorial Material (2)
Erratum (1)
Book Chapter (1)
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Year Asc
Cit. WOS Dsc
IF WOS Dsc
Cit. Scopus Dsc
IF Scopus Dsc
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Results:
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Confirmed Publications: 298
81
TITLE:
Validity of Vegard's rule for Al1-xInxN (0.08 < x < 0.28) thin films grown on GaN templates
Full Text
AUTHORS:
Magalhães, S; Franco, N; Watson, IM; Martin, RW; O'Donnell, KP; Schenk, HPD; Tang, F; Sadler, TC; Kappers, MJ; Oliver, RA;
Monteiro, T
; Martin, TL; Bagot, PAJ; Moody, MP;
Alves, E
;
Lorenz, K
;
PUBLISHED:
2017
,
SOURCE:
Journal of Physics D: Applied Physics,
VOLUME:
50,
ISSUE:
20
INDEXED IN:
Scopus
CrossRef
:
10
IN MY:
ORCID
|
CIÊNCIAVITAE
82
TITLE:
Validity of Vegard's rule for Al1-xInxN (0.08 < x < 0.28) thin films grown on GaN templates
Full Text
AUTHORS:
Magalhaes, S
;
Franco, N
;
Watson, IM
;
Martin, RW
; O'Donnell, KP; Schenk, HPD; Tang, F; Sadler, TC; Kappers, MJ; Oliver, RA; Monteiro, T; Martin, TL; Bagot, PAJ; Moody, MP;
Alves, E
;
Lorenz, K
;
PUBLISHED:
2017
,
SOURCE:
JOURNAL OF PHYSICS D-APPLIED PHYSICS,
VOLUME:
50,
ISSUE:
20
INDEXED IN:
WOS
IN MY:
ORCID
|
CIÊNCIAVITAE
83
TITLE:
Quantitative x-ray diffraction analysis of bimodal damage distributions in Tm implanted Al 0.15 Ga 0.85 N
Full Text
AUTHORS:
Magalhães, S; Fialho, M; Peres, M;
Lorenz, K
;
Alves, E
;
PUBLISHED:
2016
,
SOURCE:
Journal of Physics D: Applied Physics - J. Phys. D: Appl. Phys.,
VOLUME:
49,
ISSUE:
13
INDEXED IN:
CrossRef
IN MY:
ORCID
|
CIÊNCIAVITAE
84
TITLE:
Analysis of the Tb3+ recombination in ion implanted AlxGa1-xN (0 <= x <= 1) layers
Full Text
AUTHORS:
Rodrigues, J
; Fialho, M;
Magalhaes, S
;
Correia, MR
;
Rino, L
;
Alves, E
;
Neves, AJ
;
Lorenz, K
;
Monteiro, T
;
PUBLISHED:
2016
,
SOURCE:
JOURNAL OF LUMINESCENCE,
VOLUME:
178
INDEXED IN:
Scopus
WOS
CrossRef
:
3
IN MY:
ORCID
|
CIÊNCIAVITAE
85
TITLE:
Correction to "Spectroscopic Analysis of Eu 3+ Implanted and Annealed GaN Layers and Nanowires"
AUTHORS:
Rodrigues, J; Leitão, MF; Carreira, JFC;
Ben Sedrine, N
; Santos, NF;
Felizardo, M
; Auzelle, T; Daudin, B;
Alves, E
;
Neves, AJ
;
Correia, MR
;
Costa, FM
;
Lorenz, K
;
Monteiro, T
;
PUBLISHED:
2016
,
SOURCE:
Journal of Physical Chemistry C,
VOLUME:
120,
ISSUE:
12
INDEXED IN:
Scopus
CrossRef
:
3
IN MY:
ORCID
|
CIÊNCIAVITAE
86
TITLE:
Crystalfield symmetries of luminescent Eu3+ centers in GaN: The importance of the D-5(0) to F-7(1) transition
Full Text
AUTHORS:
O'Donnell, KP
; Edwards, PR; Yamaga, M;
Lorenz, K
; Kappers, MJ; Bockowski, M;
PUBLISHED:
2016
,
SOURCE:
APPLIED PHYSICS LETTERS,
VOLUME:
108,
ISSUE:
2
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
CIÊNCIAVITAE
87
TITLE:
Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction
Full Text
AUTHORS:
Daniel Carvalho; Knut Mueller Caspary; Marco Schowalter; Tim Grieb; Thorsten Mehrtens; Andreas Rosenauer; Teresa Ben; Rafael Garcia;
Andres Redondo Cubero
;
Katharina Lorenz
;
Bruno Daudin
; Francisco M Morales;
PUBLISHED:
2016
,
SOURCE:
SCIENTIFIC REPORTS,
VOLUME:
6
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
CIÊNCIAVITAE
88
TITLE:
Effect of AlN content on the lattice site location of terbium ions in AlxGa1-xN compounds
Full Text
AUTHORS:
Fialho, M;
Rodrigues, J
;
Magalhaes, S
;
Correia, MR
;
Monteiro, T
;
Lorenz, K
;
Alves, E
;
PUBLISHED:
2016
,
SOURCE:
SEMICONDUCTOR SCIENCE AND TECHNOLOGY,
VOLUME:
31,
ISSUE:
3
INDEXED IN:
Scopus
WOS
CrossRef
:
4
IN MY:
ORCID
|
CIÊNCIAVITAE
89
TITLE:
Identifying the influence of the intrinsic defects in Gd-doped ZnO thin-films
Full Text
AUTHORS:
Flemban, TH; Sequeira, MC; Zhang, Z; Venkatesh, S;
Alves, E
;
Lorenz, K
; Roqan, IS;
PUBLISHED:
2016
,
SOURCE:
JOURNAL OF APPLIED PHYSICS,
VOLUME:
119,
ISSUE:
6
INDEXED IN:
Scopus
WOS
CrossRef
IN MY:
ORCID
|
CIÊNCIAVITAE
90
TITLE:
Impact of implantation geometry and fluence on structural properties of AlxGa1-xN implanted with thulium
Full Text
AUTHORS:
Fialho, M; Magalhaes, S; Chauvat, MP; Ruterana, P;
Lorenz, K
;
Alves, E
;
PUBLISHED:
2016
,
SOURCE:
JOURNAL OF APPLIED PHYSICS,
VOLUME:
120,
ISSUE:
16
INDEXED IN:
Scopus
WOS
CrossRef
:
10
IN MY:
ORCID
|
CIÊNCIAVITAE
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