91
TITLE: Incorporating Systems Structure in Data-Driven High-Dimensional Predictive Modeling
AUTHORS: dos Reis, MPS;
PUBLISHED: 2018, SOURCE: 28th European Symposium on Computer-Aided Process Engineering (ESCAPE) in 28TH EUROPEAN SYMPOSIUM ON COMPUTER AIDED PROCESS ENGINEERING, VOLUME: 43
INDEXED IN: Scopus WOS CrossRef: 1
IN MY: ORCID
92
TITLE: Establishing the optimal blocks' order in SO-PLS: Stepwise SO-PLS and alternative formulations
AUTHORS: Campos, MP; Sousa, R; Reis, MS;
PUBLISHED: 2018, SOURCE: JOURNAL OF CHEMOMETRICS, VOLUME: 32, ISSUE: 8
INDEXED IN: Scopus WOS CrossRef: 8
IN MY: ORCID
93
TITLE: Which regression method to use? Making informed decisions in "data-rich/knowledge poor" scenarios - The Predictive Analytics Comparison framework (PAC)
AUTHORS: Rendall, R; Reis, MS;
PUBLISHED: 2018, SOURCE: CHEMOMETRICS AND INTELLIGENT LABORATORY SYSTEMS, VOLUME: 181
INDEXED IN: Scopus WOS CrossRef: 20
IN MY: ORCID
94
TITLE: Optimal Selection of Time Resolution for Batch Data Analysis. Part I: Predictive Modeling
AUTHORS: Rato, TJ; Reis, MS;
PUBLISHED: 2018, SOURCE: AICHE JOURNAL, VOLUME: 64, ISSUE: 11
INDEXED IN: Scopus WOS CrossRef: 7
IN MY: ORCID
95
TITLE: Assessing the Value of Information of Data-Centric Activities in the Chemical Processing Industry 4.0
AUTHORS: Reis, MS; Kenett, R;
PUBLISHED: 2018, SOURCE: AICHE JOURNAL, VOLUME: 64, ISSUE: 11
INDEXED IN: Scopus WOS CrossRef: 38
IN MY: ORCID
96
TITLE: A Systematic Framework for Assessing the Quality of Information in Data-Driven Applications for the Industry 4.0
AUTHORS: Reis, MS;
PUBLISHED: 2018, SOURCE: 10th IFAC Symposium on Advanced Control of Chemical Processes (ADCHEM) in IFAC PAPERSONLINE, VOLUME: 51, ISSUE: 18
INDEXED IN: Scopus WOS CrossRef: 8
IN MY: ORCID
97
TITLE: Multiresolution Analytics for Large Scale Industrial Processes
AUTHORS: Reis, MS; Rato, TJ;
PUBLISHED: 2018, SOURCE: 10th IFAC Symposium on Advanced Control of Chemical Processes (ADCHEM) in IFAC PAPERSONLINE, VOLUME: 51, ISSUE: 18
INDEXED IN: Scopus WOS CrossRef: 1
IN MY: ORCID
98
TITLE: Advanced Run-to-Run Controller in Semiconductor Manufacturing with Real-time Equipment Condition APC: Advanced Process Control; AM: Advanced Metrology
AUTHORS: Yang, WT; Blue, J; Roussy, A; Reis, M; Pinaton, J;
PUBLISHED: 2018, SOURCE: 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) in 2018 29TH ANNUAL SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE (ASMC)
INDEXED IN: Scopus WOS CrossRef: 1
IN MY: ORCID
99
TITLE: From another quality dimension
AUTHORS: Sampaio, P; Saraiva, P; Cubo, C; Reis, M;
PUBLISHED: 2018, SOURCE: Quality Progress, VOLUME: 51, ISSUE: 12
INDEXED IN: Scopus
IN MY: ORCID
100
TITLE: Pellet shape classification using deep neural networks
AUTHORS: Colegrove, B; Lu, B; Broadway, M; Castillo, I; Chiang, L; Rendall, R; Reis, MS;
PUBLISHED: 2018, SOURCE: 2018 Society of Plastics Engineers Annual Technical Conference, ANTEC 2018 in Annual Technical Conference - ANTEC, Conference Proceedings, VOLUME: 2018-May
INDEXED IN: Scopus
IN MY: ORCID
Page 10 of 16. Total results: 159.