Maria Beatriz Alves Sousa Santos
AuthID: R-000-AMX
51
TITLE: Test preparation methodology for high covemge of physical defects in CMOS digital ICs
AUTHORS: Santos, MB; Simges, M; Teixeira, I; Teixeira, JP;
PUBLISHED: 1995, SOURCE: 1995 European Conference on Design and Test, EDTC 1995 in Proceedings of the 1995 European Conference on Design and Test, EDTC 1995
AUTHORS: Santos, MB; Simges, M; Teixeira, I; Teixeira, JP;
PUBLISHED: 1995, SOURCE: 1995 European Conference on Design and Test, EDTC 1995 in Proceedings of the 1995 European Conference on Design and Test, EDTC 1995
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