Pedro Miguel Pinto Ramos
AuthID: R-000-F0Z
21
TITLE: Pulsed eddy currents testing using a planar matrix probe
AUTHORS: Ruben F Abrantes; Luis S Rosado; Moises Piedade; Pedro M Ramos;
PUBLISHED: 2016, SOURCE: MEASUREMENT, VOLUME: 77
AUTHORS: Ruben F Abrantes; Luis S Rosado; Moises Piedade; Pedro M Ramos;
PUBLISHED: 2016, SOURCE: MEASUREMENT, VOLUME: 77
22
TITLE: Uncertainty evaluation of multivariate quantities: A case study on electrical impedance
AUTHORS: Pedro M Ramos; Fernando M Janeiro; Pedro S Girao;
PUBLISHED: 2016, SOURCE: MEASUREMENT, VOLUME: 78
AUTHORS: Pedro M Ramos; Fernando M Janeiro; Pedro S Girao;
PUBLISHED: 2016, SOURCE: MEASUREMENT, VOLUME: 78
23
TITLE: Cloud Base Height Measurement System Based on Stereo Vision with Automatic Calibration
AUTHORS: Fernando M Janeiro; Filipe Carretas; Pedro M Ramos; Frank Wagner;
PUBLISHED: 2016, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2016 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS
AUTHORS: Fernando M Janeiro; Filipe Carretas; Pedro M Ramos; Frank Wagner;
PUBLISHED: 2016, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2016 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS
INDEXED IN: 
WOS
WOS24
TITLE: A Comparative Analysis between Genetic Algorithms and Complex Nonlinear Least Squares on Electrical Impedance Characterization
AUTHORS: Fernando M Janeiro; Pedro M Ramos;
PUBLISHED: 2016, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2016 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS
AUTHORS: Fernando M Janeiro; Pedro M Ramos;
PUBLISHED: 2016, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2016 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS
INDEXED IN: WOS
WOS25
TITLE: Vector Fitting based Automatic Circuit Identification
AUTHORS: Pedro M Ramos; Fernando M Janeiro;
PUBLISHED: 2016, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2016 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS
AUTHORS: Pedro M Ramos; Fernando M Janeiro;
PUBLISHED: 2016, SOURCE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2016 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS
INDEXED IN: WOS
WOS26
TITLE: Portable Embedded System for Contactless Measurement of Material Conductivity
AUTHORS: Nuno Rodrigues; Luis Rosado; Pedro M Ramos;
PUBLISHED: 2016, SOURCE: 21st IMEKO TC-4 International Symposium on Understanding the World through Electrical and Electronic Measurement / 19th International Workshop on ADC Modelling and Testing in PROCEEDINGS OF THE 21ST IMEKO TC-4 INTERNATIONAL SYMPOSIUM ON UNDERSTANDING THE WORLD THROUGH ELECTRICAL AND ELECTRONIC MEASUREMENT AND 19TH INTERNATIONAL WORKSHOP ON ADC MODELLING AND TESTING
AUTHORS: Nuno Rodrigues; Luis Rosado; Pedro M Ramos;
PUBLISHED: 2016, SOURCE: 21st IMEKO TC-4 International Symposium on Understanding the World through Electrical and Electronic Measurement / 19th International Workshop on ADC Modelling and Testing in PROCEEDINGS OF THE 21ST IMEKO TC-4 INTERNATIONAL SYMPOSIUM ON UNDERSTANDING THE WORLD THROUGH ELECTRICAL AND ELECTRONIC MEASUREMENT AND 19TH INTERNATIONAL WORKSHOP ON ADC MODELLING AND TESTING
INDEXED IN: WOS
WOS27
TITLE: A new dual driver planar eddy current probe with dynamically controlled induction pattern Full Text
AUTHORS: Luis S Rosado; Telmo G Santos ; Pedro M Ramos; Pedro Vilaca; Moises Piedade;
PUBLISHED: 2015, SOURCE: NDT & E INTERNATIONAL, VOLUME: 70
AUTHORS: Luis S Rosado; Telmo G Santos ; Pedro M Ramos; Pedro Vilaca; Moises Piedade;
PUBLISHED: 2015, SOURCE: NDT & E INTERNATIONAL, VOLUME: 70
28
TITLE: Microwave Doppler radar in unobtrusive health monitoring Full Text
AUTHORS: Silva Girao, PS; Postolache, O; Postolache, G; Ramos, PM; Dias Pereira, JMD;
PUBLISHED: 2015, SOURCE: Joint International-Measurement-Confederation (IMEKO) TC1-TC7-TC13 Symposium on Measurement Science Behind Safety and Security in 2014 JOINT IMEKO TC1-TC7-TC13 SYMPOSIUM: MEASUREMENT SCIENCE BEHIND SAFETY AND SECURITY, VOLUME: 588, ISSUE: 1
AUTHORS: Silva Girao, PS; Postolache, O; Postolache, G; Ramos, PM; Dias Pereira, JMD;
PUBLISHED: 2015, SOURCE: Joint International-Measurement-Confederation (IMEKO) TC1-TC7-TC13 Symposium on Measurement Science Behind Safety and Security in 2014 JOINT IMEKO TC1-TC7-TC13 SYMPOSIUM: MEASUREMENT SCIENCE BEHIND SAFETY AND SECURITY, VOLUME: 588, ISSUE: 1
29
TITLE: Evaluation of the uncertainty of electrical impedance measurements: the GUM and its Supplement 2 Full Text
AUTHORS: Pedro M Ramos; Fernando M Janeiro; Pedro S Girao;
PUBLISHED: 2015, SOURCE: Joint International-Measurement-Confederation (IMEKO) TC1-TC7-TC13 Symposium on Measurement Science Behind Safety and Security in 2014 JOINT IMEKO TC1-TC7-TC13 SYMPOSIUM: MEASUREMENT SCIENCE BEHIND SAFETY AND SECURITY, VOLUME: 588, ISSUE: 1
AUTHORS: Pedro M Ramos; Fernando M Janeiro; Pedro S Girao;
PUBLISHED: 2015, SOURCE: Joint International-Measurement-Confederation (IMEKO) TC1-TC7-TC13 Symposium on Measurement Science Behind Safety and Security in 2014 JOINT IMEKO TC1-TC7-TC13 SYMPOSIUM: MEASUREMENT SCIENCE BEHIND SAFETY AND SECURITY, VOLUME: 588, ISSUE: 1
30
TITLE: Analysis of Business Processes with Enterprise Ontology and Process Mining
AUTHORS: Artur Caetano; Pedro Pinto; Carlos Mendes; Miguel Mira da Silva ; Jose Borbinha;
PUBLISHED: 2015, SOURCE: 5th Enterprise Engineering Working Conference (EEWC) in ADVANCES IN ENTERPRISE ENGINEERING IX, VOLUME: 211
AUTHORS: Artur Caetano; Pedro Pinto; Carlos Mendes; Miguel Mira da Silva ; Jose Borbinha;
PUBLISHED: 2015, SOURCE: 5th Enterprise Engineering Working Conference (EEWC) in ADVANCES IN ENTERPRISE ENGINEERING IX, VOLUME: 211
