Xin Li
AuthID: R-004-RXV
11
TITLE: Gibbs-Markov-Young structures with (stretched) exponential tail for partially hyperbolic attractors Full Text
AUTHORS: Jose F Alves ; Xin Li;
PUBLISHED: 2015, SOURCE: ADVANCES IN MATHEMATICS, VOLUME: 279
AUTHORS: Jose F Alves ; Xin Li;
PUBLISHED: 2015, SOURCE: ADVANCES IN MATHEMATICS, VOLUME: 279
12
TITLE: A Fast Spatial Variation Modeling Algorithm for Efficient Test Cost Reduction of Analog/RF Circuits
AUTHORS: Hugo Goncalves; Xin Li; Miguel Correia ; Vitor Tavares ; John Carulli; Kenneth Butler;
PUBLISHED: 2015, SOURCE: Conference on Design Automation Test in Europe (DATE) in 2015 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE)
AUTHORS: Hugo Goncalves; Xin Li; Miguel Correia ; Vitor Tavares ; John Carulli; Kenneth Butler;
PUBLISHED: 2015, SOURCE: Conference on Design Automation Test in Europe (DATE) in 2015 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE)
INDEXED IN: 
WOS
WOS13
TITLE: DALM-SVD: Accelerated sparse coding through singular value decomposition of the dictionary
AUTHORS: Hugo R Gonçalves ; Miguel V Correia ; Xin Li; Aswin Sankaranarayanan; Vitor Tavares ;
PUBLISHED: 2014, SOURCE: 2014 IEEE International Conference on Image Processing, ICIP 2014 in 2014 IEEE International Conference on Image Processing, ICIP 2014, Paris, France, October 27-30, 2014
AUTHORS: Hugo R Gonçalves ; Miguel V Correia ; Xin Li; Aswin Sankaranarayanan; Vitor Tavares ;
PUBLISHED: 2014, SOURCE: 2014 IEEE International Conference on Image Processing, ICIP 2014 in 2014 IEEE International Conference on Image Processing, ICIP 2014, Paris, France, October 27-30, 2014
14
TITLE: Bayesian Model Fusion: Enabling Test Cost Reduction of Analog/RF Circuits via Wafer-level Spatial Variation Modeling Full Text
AUTHORS: Shanghang H Zhang; Xin Li; (Shawn) D Blanton; Jose Machado da Silva ; John M Carulli; Kenneth M Butler;
PUBLISHED: 2014, SOURCE: 45th IEEE International Test Conference (ITC) in 2014 IEEE INTERNATIONAL TEST CONFERENCE (ITC), VOLUME: 2015-February
AUTHORS: Shanghang H Zhang; Xin Li; (Shawn) D Blanton; Jose Machado da Silva ; John M Carulli; Kenneth M Butler;
PUBLISHED: 2014, SOURCE: 45th IEEE International Test Conference (ITC) in 2014 IEEE INTERNATIONAL TEST CONFERENCE (ITC), VOLUME: 2015-February
15
TITLE: DALM-SVD: ACCELERATED SPARSE CODING THROUGH SINGULAR VALUE DECOMPOSITION OF THE DICTIONARY
AUTHORS: Hugo Goncalves ; Miguel Correia ; Xin Li; Aswin Sankaranarayanan; Vitor Tavares ;
PUBLISHED: 2014, SOURCE: IEEE International Conference on Image Processing (ICIP) in 2014 IEEE INTERNATIONAL CONFERENCE ON IMAGE PROCESSING (ICIP)
AUTHORS: Hugo Goncalves ; Miguel Correia ; Xin Li; Aswin Sankaranarayanan; Vitor Tavares ;
PUBLISHED: 2014, SOURCE: IEEE International Conference on Image Processing (ICIP) in 2014 IEEE INTERNATIONAL CONFERENCE ON IMAGE PROCESSING (ICIP)
INDEXED IN: WOS
WOS