101
TITLE: A real-time optical signal and image processing p-i-n/p-i-n device
AUTHORS: Vieira, M; Louro, P ; Fernandes, M ; Fantoni, A ; Mendes, C; Martins, J;
PUBLISHED: 2004, SOURCE: Symposium on Amorphous and Nanocrystalline Silicon Science and Technology held at the 2004 MRS Spring Meeting in AMORPHOUS AND NANOCRYSTALLINE SILICON SCIENCE AND TECHNOLOGY- 2004, VOLUME: 808
INDEXED IN: Scopus WOS
102
TITLE: Non-pixeled amorphous silicon-based image sensors  Full Text
AUTHORS: Fernandes, A ; Vygranenko, Y ; Louro, P ; Vieira, A;
PUBLISHED: 2003, SOURCE: Spring Meeting of the European-Materials-Research-Society (E-MRS) in PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, VOLUME: 16, ISSUE: 3-4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
103
TITLE: Optical confinement and colour separation in a double colour laser scanned photodiode (D/CLSP)
AUTHORS: Vieira, M; Fernandes, M; Louro, P; Fantoni, A; Rodrigues, I;
PUBLISHED: 2003, SOURCE: 12th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS 03) in BOSTON TRANSDUCERS'03: DIGEST OF TECHNICAL PAPERS, VOLS 1 AND 2
INDEXED IN: WOS
104
TITLE: Image capture devices based on p-i-n silicon carbides for biometric applications  Full Text
AUTHORS: Vieira, M; Fernandes, M ; Louro, P ; Vygranenko, Y ; Fantoni, A ; Schwarz, R ; Schubert, M;
PUBLISHED: 2002, SOURCE: 19th International Conference on Amorphis and Microcrystalline Semiconductors (ICAMS 19) in JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 299, ISSUE: PART 2
INDEXED IN: Scopus WOS CrossRef
105
TITLE: Analysis of the bias dependent spectral response of a-SiC : H p-i-n photodiode
AUTHORS: Louro, P ; Fantoni, A ; Vygranenko, Y ; Fernandes, M ; Vieira, M;
PUBLISHED: 2002, SOURCE: Symposium on Amorphous and Heterogeneous Silicon-Based Films held at the 2002 MRS Spring Meeting in AMORPHOUS AND HETEROGENEOUS SILICON-BASED FILMS-2002, VOLUME: 715
INDEXED IN: Scopus WOS
106
TITLE: Low-temperature properties of compensated Ge films used for cryogenic thermometers
AUTHORS: Mitin, VF; Kholevchuk, VV; Dugaev, VK; Vieira, M;
PUBLISHED: 2002, SOURCE: Symposium on Defect and Impurity Engineered Semiconductors and Devices III held at the 2002 MRS Spring Meeting in DEFECT AND IMPURITY ENGINEERED SEMICONDUCTORS AND DEVICES III, VOLUME: 719
INDEXED IN: Scopus WOS
IN MY: ORCID
107
TITLE: Characterization and Modeling of Ge Film Thermometers for Low Temperature Measurements
AUTHORS: Dugaev, VK; Ihas, GG; McKenney, C; Kholevchuk, VV; Mitin, VF; Yu Y Nemish; Soloviev, EA; Vieira, M;
PUBLISHED: 2002, SOURCE: First IEEE International Conference on Sensors - IEEE Sensors 2002 in Proceedings of IEEE Sensors, VOLUME: 1, ISSUE: 2
INDEXED IN: Scopus
108
TITLE: Bias dependent photocurrent collection in p-i-n a-Si : EVSiC : H heterojunction
AUTHORS: Louro, P; Vieira, M; Vygranenko, Y; Fernandes, M; Schwarz, R; Schubert, M;
PUBLISHED: 2001, SOURCE: 11th International Conference on Solid-State Sensors and Actuators in TRANSDUCERS '01: EUROSENSORS XV, DIGEST OF TECHNICAL PAPERS, VOLS 1 AND 2
INDEXED IN: WOS
109
TITLE: Laser scanned photodiodes (LSP) for Image sensing
AUTHORS: Vieira, M; Fernandes, M; Louro, P; Schwarz, R; Schubert, M;
PUBLISHED: 2001, SOURCE: 11th International Conference on Solid-State Sensors and Actuators in TRANSDUCERS '01: EUROSENSORS XV, DIGEST OF TECHNICAL PAPERS, VOLS 1 AND 2
INDEXED IN: WOS
110
TITLE: The contact geometry in a 2D mu c-Si : H p-i-n imager  Full Text
AUTHORS: Martins, J; Sousa, F; Fernandes, M; Louro, P ; Macarico, A; Vieira, M;
PUBLISHED: 2000, SOURCE: Spring Meeting of the European-Materials-Research-Society in MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, VOLUME: 69
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
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