31
TITLE: Beyond single scattering off flat samples  Full Text
AUTHORS: Barradas, NP ; Fonseca, A; Franco, N; Alves, E ;
PUBLISHED: 2005, SOURCE: 18th International Conference on Application of Accelerators in Research and Industry (CAARI) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 241, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
32
TITLE: High resolution backscattering studies of nanostructured magnetic and semiconducting materials  Full Text
AUTHORS: Fonseca, A; Franco, N; Alves, E ; Barradas, NP ; Leitao, JP ; Sobolev, NA; Banhart, DF; Presting, H; Ulyanov, VV; Nikiforov, AI;
PUBLISHED: 2005, SOURCE: 18th International Conference on Application of Accelerators in Research and Industry (CAARI) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 241, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef: 13
33
TITLE: Rutherford backscattering and X-ray reflectivity analysis of tunnel barriers  Full Text
AUTHORS: Franco, N; Yavorovskiy, IV; Fonseca, A; Gouveia, JAA; Marques, C; Alves, E ; Ferreira, RA; Freitas, PP ; Barradas, NP ;
PUBLISHED: 2005, SOURCE: 8th European Conference on Accelerators in Applied Research and Technology in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 240, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef: 1
34
TITLE: Low-temperature molecular beam epitaxy of Ge on Si  Full Text
AUTHORS: Leitao, JP ; Fonseca, A; Sobolev, NA; Carmo, MC; Franco, N; Sequeira, AD; Burbaev, TM; Kurbatov, VA; Rzaev, MM; Pogosov, AO; Sibeldin, NN; Tsvetkov, VA; Lichtenberger, H; Schaffler, F;
PUBLISHED: 2005, SOURCE: 2nd International SiGe Technology and Device Meeting (ISTDM) in MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, VOLUME: 8, ISSUE: 1-3
INDEXED IN: Scopus WOS
35
TITLE: Low-temperature molecular beam epitaxy of Ge on Si  Full Text
AUTHORS: J.P Leitão; Fonseca, A; N.A Sobolev; M.C Carmo; Franco, N; A.D Sequeira; T.M Burbaev; V.A Kurbatov; M.M Rzaev; A.O Pogosov; N.N Sibeldin; V.A Tsvetkov; Lichtenberger, H; Schäffler, F;
PUBLISHED: 2005, SOURCE: Materials Science in Semiconductor Processing, VOLUME: 8, ISSUE: 1-3
INDEXED IN: CrossRef
IN MY: ORCID
36
TITLE: Structural characterization and luminescence of Ge/Si quantum dots
AUTHORS: Fonseca, A; Sobolev, NA; Leitao, JP ; Carmo, MC; Franco, N; Presting, H; Sequeira, AD;
PUBLISHED: 2004, SOURCE: 2nd International Materials Symposium in ADVANCED MATERIALS FORUM II, VOLUME: 455-456
INDEXED IN: Scopus WOS
37
TITLE: An expeditious experiment to determine the Faraday constant  Full Text
AUTHORS: Gomes, MTSR ; Oliveira, MMO; Fonseca, MA; Oliveira, JABP ;
PUBLISHED: 2004, SOURCE: JOURNAL OF CHEMICAL EDUCATION, VOLUME: 81, ISSUE: 1
INDEXED IN: Scopus WOS
38
TITLE: Pulsed laser annealing of Si-Ge superlattices  Full Text
AUTHORS: Sobolev, NA; Ivlev, GD; Gatskevich, EI; Leitao, JP ; Fonseca, A; Carmo, MC; Lopes, AB ; Sharaev, DN; Kibbel, H; Presting, H;
PUBLISHED: 2003, SOURCE: Spring Meeting of the European-Materials-Research-Society (E-MRS) in MATERIALS SCIENCE & ENGINEERING C-BIOMIMETIC AND SUPRAMOLECULAR SYSTEMS, VOLUME: 23, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef: 4
39
TITLE: Influence of defects on the luminescence of Ge/Si quantum dots  Full Text
AUTHORS: Sobolev, NA; Fonseca, A; Leitao, JP ; Carmo, MC; Presting, H; Kibbel, H;
PUBLISHED: 2003, SOURCE: 2nd International Conference on Semiconductor Quantum Dots in 2ND INTERNATIONAL CONFERENCE ON SEMICONDUCTOR QUANTUM DOTS, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef: 10
40
TITLE: Ultramicrohardness cross-profiling of CVD diamond steel brazed junctions  Full Text
AUTHORS: Fernandes, AJS; Fonseca, MJ; Costa, FM ; Silva, RF ; Nazare, MH;
PUBLISHED: 1999, SOURCE: 9th European Conference on Diamond, Diamond-like Materials, Nitrides and Silicon Carbide (Diamond 1998) in DIAMOND AND RELATED MATERIALS, VOLUME: 8, ISSUE: 2-5
INDEXED IN: Scopus WOS CrossRef: 6
Page 4 of 5. Total results: 43.