131
TITLE: Beyond single scattering off flat samples  Full Text
AUTHORS: Barradas, NP ; Fonseca, A; Franco, N; Alves, E ;
PUBLISHED: 2005, SOURCE: 18th International Conference on Application of Accelerators in Research and Industry (CAARI) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 241, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
132
TITLE: Ion beam analysis of GaInAsSb films grown by MOVPE on GaSb  Full Text
AUTHORS: Corregidor, V ; Barradas, NP ; Alves, E ; Franco, N; Alves, LC ; Chaves, PC ; Miguel A. Reis ;
PUBLISHED: 2005, SOURCE: 18th International Conference on Application of Accelerators in Research and Industry (CAARI) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 241, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
133
TITLE: Analysis of nanolayered samples with a He-4 beam  Full Text
AUTHORS: Franco, N; Gouveia, JAA; Alves, E ; Cardoso, S ; Freitas, PP ; Barradas, NP ;
PUBLISHED: 2005, SOURCE: 18th International Conference on Application of Accelerators in Research and Industry (CAARI) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 241, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
134
TITLE: High resolution backscattering studies of nanostructured magnetic and semiconducting materials  Full Text
AUTHORS: Fonseca, A; Franco, N; Alves, E ; Barradas, NP ; Leitao, JP ; Sobolev, NA; Banhart, DF; Presting, H; Ulyanov, VV; Nikiforov, AI;
PUBLISHED: 2005, SOURCE: 18th International Conference on Application of Accelerators in Research and Industry (CAARI) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 241, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef: 13
IN MY: ORCID
135
TITLE: Compositional and structural characterisation of GaSb and GaInSb  Full Text
AUTHORS: Corregidor, V ; Alves, E ; Alves, LC ; Barradas, NP ; Duffar, T; Franco, N; Marques, C; Mitric, A;
PUBLISHED: 2005, SOURCE: 8th European Conference on Accelerators in Applied Research and Technology in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 240, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
136
TITLE: Rutherford backscattering and X-ray reflectivity analysis of tunnel barriers  Full Text
AUTHORS: Franco, N; Yavorovskiy, IV; Fonseca, A; Gouveia, JAA; Marques, C; Alves, E ; Ferreira, RA; Freitas, PP ; Barradas, NP ;
PUBLISHED: 2005, SOURCE: 8th European Conference on Accelerators in Applied Research and Technology in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 240, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef: 1
IN MY: ORCID
137
TITLE: Exchange bias in ordered antiferromagnets by rapid thermal anneal without magnetic field  Full Text
AUTHORS: Rickart, M; Guedes, A; Franco, N; Barradas, NP ; Diaz, P; MacKenzie, M; Chapman, JN; Freitas, PP ;
PUBLISHED: 2005, SOURCE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 38, ISSUE: 13
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
138
TITLE: Characterization of CoFeB electrodes for tunnel junctions  Full Text
AUTHORS: Cardoso, S ; Cavaco, C; Ferreira, R; Pereira, L; Rickart, M; Freitas, PP ; Franco, N; Gouveia, J; Barradas, NP ;
PUBLISHED: 2005, SOURCE: 49th Annual Conference on Magnetism and Magnetic Materials in JOURNAL OF APPLIED PHYSICS, VOLUME: 97, ISSUE: 10
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
139
TITLE: Low-temperature molecular beam epitaxy of Ge on Si  Full Text
AUTHORS: Leitao, JP ; Fonseca, A; Sobolev, NA; Carmo, MC; Franco, N; Sequeira, AD; Burbaev, TM; Kurbatov, VA; Rzaev, MM; Pogosov, AO; Sibeldin, NN; Tsvetkov, VA; Lichtenberger, H; Schaffler, F;
PUBLISHED: 2005, SOURCE: 2nd International SiGe Technology and Device Meeting (ISTDM) in MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, VOLUME: 8, ISSUE: 1-3
INDEXED IN: Scopus WOS
IN MY: ORCID
140
TITLE: Low-temperature molecular beam epitaxy of Ge on Si  Full Text
AUTHORS: J.P Leitão; Fonseca, A; N.A Sobolev; M.C Carmo; Franco, N; A.D Sequeira; T.M Burbaev; V.A Kurbatov; M.M Rzaev; A.O Pogosov; N.N Sibeldin; V.A Tsvetkov; Lichtenberger, H; Schäffler, F;
PUBLISHED: 2005, SOURCE: Materials Science in Semiconductor Processing, VOLUME: 8, ISSUE: 1-3
INDEXED IN: CrossRef
IN MY: ORCID
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