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TITLE: A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing
AUTHORS: Arpaia, P; Serra, AMD ; Daponte, P; Monteiro, CL;
PUBLISHED: 2001, SOURCE: Instrumentation and Measurement Technology Conference (IMTC 2000) in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 50, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
12
TITLE: ADC testing based on IEEE 1057-94 Standard - some critical notes
AUTHORS: Pasquale Arpaia; Antonio Cruz Serra; Pasquale Daponte; Conceicao Libano Monteiro;
PUBLISHED: 2000, SOURCE: IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control' in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
INDEXED IN: Scopus
Page 2 of 2. Total results: 12.