Pasquale Arpaia
AuthID: R-006-NJG
11
TITLE: Analytical design of dual-tone signal for ADC phase-plane testing Full Text
AUTHORS: Conceicao Libano Monteiro; Pasquale Arpaia; Antonio Cruz Serra ;
PUBLISHED: 2010, SOURCE: MEASUREMENT, VOLUME: 43, ISSUE: 3
AUTHORS: Conceicao Libano Monteiro; Pasquale Arpaia; Antonio Cruz Serra ;
PUBLISHED: 2010, SOURCE: MEASUREMENT, VOLUME: 43, ISSUE: 3
12
TITLE: A frequency-domain approach to ADC phase-plane modeling and testing
AUTHORS: Monteiro, CL; Arpaia, P; Serra, AC;
PUBLISHED: 2003, SOURCE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
AUTHORS: Monteiro, CL; Arpaia, P; Serra, AC;
PUBLISHED: 2003, SOURCE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
INDEXED IN: 
Scopus
Scopus13
TITLE: Performance analysis of an ADC histogram test using small triangular waves
AUTHORS: Alegria, F ; Arpaia, P; Serra, AMD ; Daponte, P;
PUBLISHED: 2002, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 51, ISSUE: 4
AUTHORS: Alegria, F ; Arpaia, P; Serra, AMD ; Daponte, P;
PUBLISHED: 2002, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 51, ISSUE: 4
14
TITLE: A comprehensive phase-spectrum approach to metrological characterization of hysteretic ADCs
AUTHORS: Monteiro, CL; Arpaia, P; Serra, AC ;
PUBLISHED: 2002, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 51, ISSUE: 4
AUTHORS: Monteiro, CL; Arpaia, P; Serra, AC ;
PUBLISHED: 2002, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 51, ISSUE: 4
15
TITLE: A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing
AUTHORS: Arpaia, P; Serra, AMD ; Daponte, P; Monteiro, CL;
PUBLISHED: 2001, SOURCE: Instrumentation and Measurement Technology Conference (IMTC 2000) in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 50, ISSUE: 4
AUTHORS: Arpaia, P; Serra, AMD ; Daponte, P; Monteiro, CL;
PUBLISHED: 2001, SOURCE: Instrumentation and Measurement Technology Conference (IMTC 2000) in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 50, ISSUE: 4
16
TITLE: ADC testing based on IEEE 1057-94 Standard - some critical notes
AUTHORS: Pasquale Arpaia; Antonio Cruz Serra; Pasquale Daponte; Conceicao Libano Monteiro;
PUBLISHED: 2000, SOURCE: IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control' in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
AUTHORS: Pasquale Arpaia; Antonio Cruz Serra; Pasquale Daponte; Conceicao Libano Monteiro;
PUBLISHED: 2000, SOURCE: IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control' in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
INDEXED IN: Scopus
Scopus