171
TITLE: CHARACTERIZATION OF INGAAS/ALGAAS/GAAS HETEROEPITAXIAL STRUCTURES BY TRANSMISSION ELECTRON-MICROSCOPY AND ENERGY-DISPERSIVE SPECTROSCOPY
AUTHORS: RAI, RS; TARTAGLIA, JM; QUINN, WE; MARTEL, DC;
PUBLISHED: 1993, SOURCE: PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, VOLUME: 27, ISSUE: 1
INDEXED IN: WOS CrossRef: 1
IN MY: ORCID
172
TITLE: TEM CHARACTERIZATION OF (HG,CD)TE/CDTE HETEROEPITAXIAL LAYERS
AUTHORS: RAI, RS;
PUBLISHED: 1993, SOURCE: MICROSTRUCTURE OF MATERIALS
INDEXED IN: WOS
IN MY: ORCID
173
TITLE: VERTICAL-CAVITY OPTOELECTRONIC STRUCTURES - CAD, GROWTH, AND STRUCTURAL CHARACTERIZATION
AUTHORS: CHRISTENSEN, DH; CROCHIERE, SM; PELLEGRINO, JG; RAI, RS; PARSONS, CA; TSENG, WF; HICKERNELL, RK;
PUBLISHED: 1993, SOURCE: SEMICONDUCTOR HETEROSTRUCTURES FOR PHOTONIC AND ELECTRONIC APPLICATIONS, VOLUME: 281
INDEXED IN: WOS
IN MY: ORCID
174
TITLE: CHARACTERIZATION OF ALGAAS/INGAAS/GAAS HETEROEPITAXIAL LAYERS BY TRANSMISSION ELECTRON-MICROSCOPY AND ENERGY-DISPERSIVE SPECTROSCOPY
AUTHORS: RAI, RS; TARTAGLIA, JM; QUINN, WE; MARTEL, DC;
PUBLISHED: 1993, SOURCE: SEMICONDUCTOR HETEROSTRUCTURES FOR PHOTONIC AND ELECTRONIC APPLICATIONS, VOLUME: 281
INDEXED IN: WOS
IN MY: ORCID
175
TITLE: VERTICAL-CAVITY SEMICONDUCTOR-LASERS - STRUCTURAL CHARACTERIZATION, CAD, AND DFB STRUCTURES
AUTHORS: CHRISTENSEN, DH; PARSONS, CA; PELLEGRINO, JG; HILL, JR; RAI, RS; CROCHIERE, SM; HICKERNELL, RK; SCHAAFSMA, DT;
PUBLISHED: 1993, SOURCE: LASER DIODE TECHNOLOGY AND APPLICATIONS V, VOLUME: 1850
INDEXED IN: WOS CrossRef: 4
IN MY: ORCID
178
TITLE: CVD AND CHARACTERIZATION OF AL-CU METALLIZATION THIN-FILMS
AUTHORS: HOULDING, VH; MAXWELL, H; CROCHIERE, SM; FARRINGTON, DL; RAI, RS; TARTAGLIA, JM;
PUBLISHED: 1992, SOURCE: ADVANCED METALLIZATION AND PROCESSING FOR SEMICONDUCTOR DEVICES AND CIRCUITS - II, VOLUME: 260
INDEXED IN: WOS CrossRef: 6
IN MY: ORCID
179
TITLE: CHARACTERIZATION OF VERTICAL-CAVITY SEMICONDUCTOR STRUCTURES
AUTHORS: CHRISTENSEN, DH; PELLEGRINO, JG; HICKERNELL, RK; CROCHIERE, SM; PARSONS, CA; RAI, RS;
PUBLISHED: 1992, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 72, ISSUE: 12
INDEXED IN: WOS CrossRef: 15
IN MY: ORCID
180
TITLE: CHARACTERIZATION OF CDTE, (CD,ZN)TE, AND CD(TE,SE)SINGLE CRYSTALS BY TRANSMISSION ELECTRON-MICROSCOPY
AUTHORS: RAI, RS; MAHAJAN, S; MCDEVITT, S; JOHNSON, CJ;
PUBLISHED: 1991, SOURCE: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, VOLUME: 9, ISSUE: 3
INDEXED IN: WOS CrossRef: 43
IN MY: ORCID
Page 18 of 25. Total results: 244.