Radheshyam Rai
AuthID: R-000-NEM
171
TITLE: CORRELATION OF OPTICAL, X-RAY, AND ELECTRON-MICROSCOPY MEASUREMENTS ON SEMICONDUCTOR MULTILAYER STRUCTURES
AUTHORS: CHRISTENSEN, DH; HICKERNELL, RK; SCHAAFSMA, DT; PELLEGRINO, JG; MCCOLLUM, MJ; HILL, JR; RAI, RS;
PUBLISHED: 1994, SOURCE: SPECTROSCOPIC CHARACTERIZATION TECHNIQUES FOR SEMICONDUCTOR TECHNOLOGY V, VOLUME: 2141
AUTHORS: CHRISTENSEN, DH; HICKERNELL, RK; SCHAAFSMA, DT; PELLEGRINO, JG; MCCOLLUM, MJ; HILL, JR; RAI, RS;
PUBLISHED: 1994, SOURCE: SPECTROSCOPIC CHARACTERIZATION TECHNIQUES FOR SEMICONDUCTOR TECHNOLOGY V, VOLUME: 2141
172
TITLE: MYOCARDIAL-INFARCTION DURING PREGNANCY
AUTHORS: RAI, RS; CLIFFORD, K; REGAN, L;
PUBLISHED: 1994, SOURCE: BRITISH JOURNAL OF OBSTETRICS AND GYNAECOLOGY, VOLUME: 101, ISSUE: 5
AUTHORS: RAI, RS; CLIFFORD, K; REGAN, L;
PUBLISHED: 1994, SOURCE: BRITISH JOURNAL OF OBSTETRICS AND GYNAECOLOGY, VOLUME: 101, ISSUE: 5
173
TITLE: CHARACTERIZING III-V HETEROEPITAXIAL STRUCTURES
AUTHORS: RAI, RS; PARSONS, CA;
PUBLISHED: 1994, SOURCE: JOM-JOURNAL OF THE MINERALS METALS & MATERIALS SOCIETY, VOLUME: 46, ISSUE: 9
AUTHORS: RAI, RS; PARSONS, CA;
PUBLISHED: 1994, SOURCE: JOM-JOURNAL OF THE MINERALS METALS & MATERIALS SOCIETY, VOLUME: 46, ISSUE: 9
174
TITLE: CHARACTERIZATION OF INGAAS/ALGAAS/GAAS HETEROEPITAXIAL STRUCTURES BY TRANSMISSION ELECTRON-MICROSCOPY AND ENERGY-DISPERSIVE SPECTROSCOPY
AUTHORS: RAI, RS; TARTAGLIA, JM; QUINN, WE; MARTEL, DC;
PUBLISHED: 1993, SOURCE: PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, VOLUME: 27, ISSUE: 1
AUTHORS: RAI, RS; TARTAGLIA, JM; QUINN, WE; MARTEL, DC;
PUBLISHED: 1993, SOURCE: PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, VOLUME: 27, ISSUE: 1
175
TITLE: TEM CHARACTERIZATION OF (HG,CD)TE/CDTE HETEROEPITAXIAL LAYERS
AUTHORS: RAI, RS;
PUBLISHED: 1993, SOURCE: MICROSTRUCTURE OF MATERIALS
AUTHORS: RAI, RS;
PUBLISHED: 1993, SOURCE: MICROSTRUCTURE OF MATERIALS
INDEXED IN: 
WOS
WOS IN MY: 
ORCID
ORCID176
TITLE: VERTICAL-CAVITY OPTOELECTRONIC STRUCTURES - CAD, GROWTH, AND STRUCTURAL CHARACTERIZATION
AUTHORS: CHRISTENSEN, DH; CROCHIERE, SM; PELLEGRINO, JG; RAI, RS; PARSONS, CA; TSENG, WF; HICKERNELL, RK;
PUBLISHED: 1993, SOURCE: SEMICONDUCTOR HETEROSTRUCTURES FOR PHOTONIC AND ELECTRONIC APPLICATIONS, VOLUME: 281
AUTHORS: CHRISTENSEN, DH; CROCHIERE, SM; PELLEGRINO, JG; RAI, RS; PARSONS, CA; TSENG, WF; HICKERNELL, RK;
PUBLISHED: 1993, SOURCE: SEMICONDUCTOR HETEROSTRUCTURES FOR PHOTONIC AND ELECTRONIC APPLICATIONS, VOLUME: 281
INDEXED IN: WOS
WOS IN MY: ORCID
ORCID177
TITLE: CHARACTERIZATION OF ALGAAS/INGAAS/GAAS HETEROEPITAXIAL LAYERS BY TRANSMISSION ELECTRON-MICROSCOPY AND ENERGY-DISPERSIVE SPECTROSCOPY
AUTHORS: RAI, RS; TARTAGLIA, JM; QUINN, WE; MARTEL, DC;
PUBLISHED: 1993, SOURCE: SEMICONDUCTOR HETEROSTRUCTURES FOR PHOTONIC AND ELECTRONIC APPLICATIONS, VOLUME: 281
AUTHORS: RAI, RS; TARTAGLIA, JM; QUINN, WE; MARTEL, DC;
PUBLISHED: 1993, SOURCE: SEMICONDUCTOR HETEROSTRUCTURES FOR PHOTONIC AND ELECTRONIC APPLICATIONS, VOLUME: 281
INDEXED IN: WOS
WOS IN MY: ORCID
ORCID178
TITLE: VERTICAL-CAVITY SEMICONDUCTOR-LASERS - STRUCTURAL CHARACTERIZATION, CAD, AND DFB STRUCTURES
AUTHORS: CHRISTENSEN, DH; PARSONS, CA; PELLEGRINO, JG; HILL, JR; RAI, RS; CROCHIERE, SM; HICKERNELL, RK; SCHAAFSMA, DT;
PUBLISHED: 1993, SOURCE: LASER DIODE TECHNOLOGY AND APPLICATIONS V, VOLUME: 1850
AUTHORS: CHRISTENSEN, DH; PARSONS, CA; PELLEGRINO, JG; HILL, JR; RAI, RS; CROCHIERE, SM; HICKERNELL, RK; SCHAAFSMA, DT;
PUBLISHED: 1993, SOURCE: LASER DIODE TECHNOLOGY AND APPLICATIONS V, VOLUME: 1850
179
TITLE: AN INTEGRATED APPROACH FOR UTILIZATION OF OVERBURDEN FOR STOWING IN THICK SEAMS EXTRACTION AND BACK FILLING IN EXHAUSTED QUARRIES
AUTHORS: RAI, RS;
PUBLISHED: 1993, SOURCE: THICK SEAM MINING
AUTHORS: RAI, RS;
PUBLISHED: 1993, SOURCE: THICK SEAM MINING
INDEXED IN: WOS
WOS IN MY: ORCID
ORCID180
TITLE: EXPERIENCE WITH SIMULTANEOUS 3 LIFT LONGWALL EXTRACTION OF 9 M. THICK LOW STRENGTH COAL SEAM AT 450 M. DEPTH AT JITPUR-COLLIERY
AUTHORS: RAI, RS;
PUBLISHED: 1993, SOURCE: THICK SEAM MINING
AUTHORS: RAI, RS;
PUBLISHED: 1993, SOURCE: THICK SEAM MINING
INDEXED IN: WOS
WOS IN MY: ORCID
ORCID