António Manuel Cruz Serra
AuthID: R-000-28E
21
TITLE: Measuring channel switching error in data acquisition systems
AUTHORS: Corrêa Alegria, F; Ramos, P; Serra, AC;
PUBLISHED: 2003, SOURCE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
AUTHORS: Corrêa Alegria, F; Ramos, P; Serra, AC;
PUBLISHED: 2003, SOURCE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
INDEXED IN: 
Scopus
Scopus22
TITLE: Stochastic approach for memoryless nonlinearity measurements
AUTHORS: Martins, RC; Serra, AC;
PUBLISHED: 2003, SOURCE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
AUTHORS: Martins, RC; Serra, AC;
PUBLISHED: 2003, SOURCE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
INDEXED IN: Scopus
Scopus23
TITLE: Measuring channel switching error in data acquisition systems
AUTHORS: Corrêa Alegria, F; Ramos, P; Serra, AC;
PUBLISHED: 2003, SOURCE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
AUTHORS: Corrêa Alegria, F; Ramos, P; Serra, AC;
PUBLISHED: 2003, SOURCE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
INDEXED IN: Scopus
Scopus24
TITLE: Stochastic approach for memoryless nonlinearity measurements
AUTHORS: Martins, RC; Serra, AC;
PUBLISHED: 2003, SOURCE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
AUTHORS: Martins, RC; Serra, AC;
PUBLISHED: 2003, SOURCE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
INDEXED IN: Scopus
Scopus IN MY: 
ORCID
ORCID25
TITLE: Measuring channel switching error in data acquisition systems
AUTHORS: Corrêa Alegria, F; Ramos, P; Serra, AC;
PUBLISHED: 2003, SOURCE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
AUTHORS: Corrêa Alegria, F; Ramos, P; Serra, AC;
PUBLISHED: 2003, SOURCE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
INDEXED IN: Scopus
Scopus IN MY: ORCID
ORCID26
TITLE: A frequency-domain approach to ADC phase-plane modeling and testing
AUTHORS: Monteiro, CL; Arpaia, P; Serra, AC;
PUBLISHED: 2003, SOURCE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
AUTHORS: Monteiro, CL; Arpaia, P; Serra, AC;
PUBLISHED: 2003, SOURCE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
INDEXED IN: Scopus
Scopus IN MY: ORCID
ORCID27
TITLE: A new robust four parameter sine fitting procedure
AUTHORS: Da Silva, MF; Serra, AC;
PUBLISHED: 2002, SOURCE: 4th IMEKO TC4 Conference on Advanced A/D and D/A Conversion Techniques and Their Applications and the 7th Workshop on ADC Modelling and Testing 2002 in 4th IMEKO TC4 Conference on Advanced A/D and D/A Conversion Techniques and Their Applications and the 7th Workshop on ADC Modelling and Testing 2002
AUTHORS: Da Silva, MF; Serra, AC;
PUBLISHED: 2002, SOURCE: 4th IMEKO TC4 Conference on Advanced A/D and D/A Conversion Techniques and Their Applications and the 7th Workshop on ADC Modelling and Testing 2002 in 4th IMEKO TC4 Conference on Advanced A/D and D/A Conversion Techniques and Their Applications and the 7th Workshop on ADC Modelling and Testing 2002
INDEXED IN: Scopus
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ORCID28
TITLE: New trends in analog to digital converters testing
AUTHORS: Serra, AC;
PUBLISHED: 2002, SOURCE: 4th IMEKO TC4 Conference on Advanced A/D and D/A Conversion Techniques and Their Applications and the 7th Workshop on ADC Modelling and Testing 2002 in 4th IMEKO TC4 Conference on Advanced A/D and D/A Conversion Techniques and Their Applications and the 7th Workshop on ADC Modelling and Testing 2002
AUTHORS: Serra, AC;
PUBLISHED: 2002, SOURCE: 4th IMEKO TC4 Conference on Advanced A/D and D/A Conversion Techniques and Their Applications and the 7th Workshop on ADC Modelling and Testing 2002 in 4th IMEKO TC4 Conference on Advanced A/D and D/A Conversion Techniques and Their Applications and the 7th Workshop on ADC Modelling and Testing 2002
INDEXED IN: Scopus
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ORCID29
TITLE: Impedance measurement using sine fitting algorithms
AUTHORS: Manuel Fonseca da Silva; Pedro Miguel Ramos; António Manuel da Cruz Serra;
PUBLISHED: 2002, SOURCE: 12th IMEKO TC4 International Symposium Electrical Measurements and Instrumentation
AUTHORS: Manuel Fonseca da Silva; Pedro Miguel Ramos; António Manuel da Cruz Serra;
PUBLISHED: 2002, SOURCE: 12th IMEKO TC4 International Symposium Electrical Measurements and Instrumentation
INDEXED IN: Scopus
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ORCID30
TITLE: Extending digital input/output capabilities to low-cost and NON-linear a/d conversion
AUTHORS: Dias Pereira, JM; Postolache, O; Cruz Serra, A; Silva Girão, P;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
AUTHORS: Dias Pereira, JM; Postolache, O; Cruz Serra, A; Silva Girão, P;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
INDEXED IN: Scopus
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ORCID