António Manuel Cruz Serra
AuthID: R-000-28E
11
TITLE: Characterization of a high resolution acquisition system for marine geophysical applications Full Text
AUTHORS: Panahi, SS; Alegria, F; Manuel, A;
PUBLISHED: 2006, SOURCE: IMTC'06 - IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference
AUTHORS: Panahi, SS; Alegria, F; Manuel, A;
PUBLISHED: 2006, SOURCE: IMTC'06 - IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference
INDEXED IN: 
Scopus 
CrossRef
Scopus CrossRef12
TITLE: Measurement and representation of the ADC integral nonlinearity in the time domain
AUTHORS: Martins, RC; Serra, AC;
PUBLISHED: 2004, SOURCE: 9th IMEKO Workshop on ADC Modeling and Testing, IWADC 2004, Held Together with the 13th IMEKO TC4 Symposium on Measurements for Research and Industrial Applications in 9th IMEKO Workshop on ADC Modeling and Testing, IWADC 2004, Held Together with the 13th IMEKO TC4 Symposium on Measurements for Research and Industrial Applications
AUTHORS: Martins, RC; Serra, AC;
PUBLISHED: 2004, SOURCE: 9th IMEKO Workshop on ADC Modeling and Testing, IWADC 2004, Held Together with the 13th IMEKO TC4 Symposium on Measurements for Research and Industrial Applications in 9th IMEKO Workshop on ADC Modeling and Testing, IWADC 2004, Held Together with the 13th IMEKO TC4 Symposium on Measurements for Research and Industrial Applications
INDEXED IN: Scopus
Scopus13
TITLE: Measuring channel switching error in data acquisition systems
AUTHORS: Corrêa Alegria, F; Ramos, P; Serra, AC;
PUBLISHED: 2003, SOURCE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
AUTHORS: Corrêa Alegria, F; Ramos, P; Serra, AC;
PUBLISHED: 2003, SOURCE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
INDEXED IN: Scopus
Scopus14
TITLE: Stochastic approach for memoryless nonlinearity measurements
AUTHORS: Martins, RC; Serra, AC;
PUBLISHED: 2003, SOURCE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
AUTHORS: Martins, RC; Serra, AC;
PUBLISHED: 2003, SOURCE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
INDEXED IN: Scopus
Scopus15
TITLE: Measuring channel switching error in data acquisition systems
AUTHORS: Corrêa Alegria, F; Ramos, P; Serra, AC;
PUBLISHED: 2003, SOURCE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
AUTHORS: Corrêa Alegria, F; Ramos, P; Serra, AC;
PUBLISHED: 2003, SOURCE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
INDEXED IN: Scopus
Scopus16
TITLE: New trends in analog to digital converters testing
AUTHORS: Serra, AC;
PUBLISHED: 2002, SOURCE: 4th IMEKO TC4 Conference on Advanced A/D and D/A Conversion Techniques and Their Applications and the 7th Workshop on ADC Modelling and Testing 2002 in 4th IMEKO TC4 Conference on Advanced A/D and D/A Conversion Techniques and Their Applications and the 7th Workshop on ADC Modelling and Testing 2002
AUTHORS: Serra, AC;
PUBLISHED: 2002, SOURCE: 4th IMEKO TC4 Conference on Advanced A/D and D/A Conversion Techniques and Their Applications and the 7th Workshop on ADC Modelling and Testing 2002 in 4th IMEKO TC4 Conference on Advanced A/D and D/A Conversion Techniques and Their Applications and the 7th Workshop on ADC Modelling and Testing 2002
INDEXED IN: Scopus
Scopus17
TITLE: Nonlinearities, the generators perspective in ADC statistical testing techniques
AUTHORS: Martins, RC; Serra, AC;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
AUTHORS: Martins, RC; Serra, AC;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
INDEXED IN: Scopus
Scopus18
TITLE: ADC testing based on IEEE 1057-94 Standard - some critical notes
AUTHORS: Pasquale Arpaia; Antonio Cruz Serra; Pasquale Daponte; Conceicao Libano Monteiro;
PUBLISHED: 2000, SOURCE: IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control' in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
AUTHORS: Pasquale Arpaia; Antonio Cruz Serra; Pasquale Daponte; Conceicao Libano Monteiro;
PUBLISHED: 2000, SOURCE: IMTC/2000 - 17th IEEE Instrumentation and Measurement Technology Conference 'Smart Connectivity: Integrating Measurement and Control' in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
INDEXED IN: Scopus
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ORCID
ORCID19
TITLE: ADC characterization by using the histogram test stimulated by Gaussian noise Full Text
AUTHORS: Raul Carneiro Martins; António Cruz Serra;
PUBLISHED: 2000, SOURCE: Measurement, VOLUME: 27, ISSUE: 4
AUTHORS: Raul Carneiro Martins; António Cruz Serra;
PUBLISHED: 2000, SOURCE: Measurement, VOLUME: 27, ISSUE: 4
20
TITLE: Logic Analyzers
AUTHORS: Pedro M B Silva Gir��o; Ant��nio M Cruz Serra; Helena M Geirinhas Ramos ;
PUBLISHED: 1999, SOURCE: Wiley Encyclopedia of Electrical and Electronics Engineering
AUTHORS: Pedro M B Silva Gir��o; Ant��nio M Cruz Serra; Helena M Geirinhas Ramos ;
PUBLISHED: 1999, SOURCE: Wiley Encyclopedia of Electrical and Electronics Engineering
INDEXED IN: CrossRef
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