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TITLE: High-density polyethylene reinforced with carbon dots for improved processing cycles and recyclability traceability  Full Text
AUTHORS: Simoes, Raul; Rodrigues, Joana; Podvratnik, Zan; Girao, Ana Violeta; Alberto, Nelia; Emami, Nazanin; Neto, Victor; Monteiro, Teresa ; Goncalves, Gil;
PUBLISHED: 2025, SOURCE: COMPOSITES PART A-APPLIED SCIENCE AND MANUFACTURING, VOLUME: 192
INDEXED IN: Scopus WOS CrossRef
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TITLE: Encapsulated Mesenchymal Stromal Cells as Cyclic Providers of Immunomodulatory Secretomes: A Living on-Demand Delivery System  Full Text
AUTHORS: Sousa, Ana Rita; Goncalves, Diana C.; Neves, Beatriz Guapo; Santos Coquillat, Ana; Oliveira, Mariana B.; Mano, Joao F.;
PUBLISHED: 2024, SOURCE: ADVANCED HEALTHCARE MATERIALS, VOLUME: 13, ISSUE: 17
INDEXED IN: Scopus WOS CrossRef: 2
5
TITLE: GRAPHENE-BASED SCAFFOLDS: IN VITRO CELL CULTURE UNDER DINAMIC MICROENVIRONMENT
AUTHORS: Paula A A P Marques; Andre Girao; Antonio Completo; Gil Goncalves;
PUBLISHED: 2017, SOURCE: 7th International Conference on Mechanics and Materials in Design (M2D) in PROCEEDINGS OF THE 7TH INTERNATIONAL CONFERENCE ON MECHANICS AND MATERIALS IN DESIGN (M2D2017)
INDEXED IN: WOS
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TITLE: Graphene: The Missing Piece for Cancer Diagnosis?  Full Text
AUTHORS: Sandra M A Cruz; Andre F Girao; Gil Goncalves; Paula A A P Marques;
PUBLISHED: 2016, SOURCE: SENSORS, VOLUME: 16, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef: 17
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TITLE: Biological synthesis of nanosized sulfide semiconductors: current status and future prospects  Full Text
AUTHORS: da Costa, JP; Girao, AV; Trindade, T; Costa, MC ; Duarte, A; Rocha Santos, T;
PUBLISHED: 2016, SOURCE: APPLIED MICROBIOLOGY AND BIOTECHNOLOGY, VOLUME: 100, ISSUE: 19
INDEXED IN: Scopus WOS CrossRef Handle
IN MY: ORCID
10
TITLE: A SELF-ASSEMBLED 3D GO-COL COMPOSITE SCAFFOLD FOR TISSUE ENGINEERING APPLICATIONS
AUTHORS: Andre F Girao; Gil Goncalves; Antonio Completo; Paula A A P Marques;
PUBLISHED: 2016, SOURCE: 5th International Conference on Integrity-Reliability-Failure (IRF) in IRF2016: 5TH INTERNATIONAL CONFERENCE INTEGRITY-RELIABILITY-FAILURE
INDEXED IN: WOS
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