121
TITLE: Secondary ion mass spectrometry characterization of NdBa<sub>2</sub>Cu<sub>3</sub>O<sub>7-x</sub> and EuBa<sub>2</sub>Cu<sub>3</sub>O<sub>7-x</sub> single crystals
AUTHORS: Fabrizio, M; Pagura, C; Tolstogouzov, A; Daolio, S; Ferretti, M; Magnone, E; Olcese, GL;
PUBLISHED: 1998, SOURCE: RAPID COMMUNICATIONS IN MASS SPECTROMETRY, VOLUME: 12, ISSUE: 11
INDEXED IN: WOS
IN MY: ORCID
122
TITLE: Detection system for an ion-probe microanalyzer
AUTHORS: Tolstoguzov, AB; Mamontov, EV;
PUBLISHED: 1996, SOURCE: Pribory i Tekhnika Eksperimenta, ISSUE: 5
INDEXED IN: Scopus
IN MY: ORCID
123
TITLE: Registration system for an ion microprobe
AUTHORS: Tolstoguzov, AB; Mamontov, EV;
PUBLISHED: 1996, SOURCE: Instruments and Experimental Techniques, VOLUME: 39, ISSUE: 5
INDEXED IN: Scopus
IN MY: ORCID
124
125
TITLE: Telemicroscope for an ion-probe micro-analyzer
AUTHORS: Tolstoguzov, AB;
PUBLISHED: 1995, SOURCE: Pribory i Tekhnika Eksperimenta, ISSUE: 2
INDEXED IN: Scopus
IN MY: ORCID
126
TITLE: SIMS imaging: Apparatus and applications
AUTHORS: Tolstogouzov, AB; Kitaeva, TI; Volkov, SS;
PUBLISHED: 1994, SOURCE: Mikrochimica Acta, VOLUME: 114-115, ISSUE: 1
INDEXED IN: Scopus CrossRef
IN MY: ORCID
127
TITLE: SIMS IMAGING - APPARATUS AND APPLICATIONS
AUTHORS: TOLSTOGOUZOV, AB; KITAEVA, TI; VOLKOV, SS;
PUBLISHED: 1994, SOURCE: MIKROCHIMICA ACTA, VOLUME: 114
INDEXED IN: WOS
IN MY: ORCID
128
TITLE: LAMINAR ANALYSIS OF THIN-FILM SAMPLES BY THE MASS-SPECTROMETRY TECHNIQUE OF SECONDARY IONS WITH ADDITIONAL REGISTRATION OF CURRENT SAMPLE
AUTHORS: TOLSTOGUZOV, AB; KITAEVA, TI;
PUBLISHED: 1994, SOURCE: PISMA V ZHURNAL TEKHNICHESKOI FIZIKI, VOLUME: 20, ISSUE: 16
INDEXED IN: WOS
IN MY: ORCID
129
TITLE: Research of integral circuits by means of secondary ion emission
AUTHORS: Aristarkhova, AA; Volkov, SS; Kitaeva, TI; Klimkovich, BV; Ya Y Krasnitskij; Mal'chenkov, AP; Yu I Torgashin; Tolstoguzov, AB; Chumakov, EN;
PUBLISHED: 1993, SOURCE: Radiotekhnika i Elektronika, VOLUME: 38, ISSUE: 1
INDEXED IN: Scopus
IN MY: ORCID
130
TITLE: Thermal stability of tungsten nitride (WN) films deposited by ion beam sputtering on GaAs substrates
AUTHORS: Galanin, SG; Kuznetsov, GD; Tolstoguzov, AB; Ya Y Chernyak;
PUBLISHED: 1993, SOURCE: Fizika i Khimiya Obrabotki Materialov, ISSUE: 5
INDEXED IN: Scopus
IN MY: ORCID
Page 13 of 14. Total results: 140.