11
TITLE: Ion damage overrides structural disorder in silicon surface nanopatterning by low-energy ion beam sputtering
AUTHORS: Moreno Barrado, A; Gago, R; Redondo Cubero, A; Vazquez, L; Munoz Garcia, J; Cuerno, R; Lorenz, K; Castro, M;
PUBLISHED: 2015, SOURCE: EPL, VOLUME: 109, ISSUE: 4
INDEXED IN: Scopus WOS
12
TITLE: Luminescence studies on green emitting InGaN/GaN MQWs implanted with nitrogen  Full Text
AUTHORS: Marco A Sousa; Teresa C Esteves; Nabiha Ben Sedrine; Joana Rodrigues; Marcio B Lourenco; Andres Redondo Cubero; Eduardo Alves; Kevin P O'Donnell; Michal Bockowski; Christian Wetzel; Maria R Correia; Katharina Lorenz; Teresa Monteiro;
PUBLISHED: 2015, SOURCE: SCIENTIFIC REPORTS, VOLUME: 5
INDEXED IN: Scopus WOS CrossRef: 13
13
TITLE: Self-consistent depth profiling and imaging of GaN-based transistors using ion microbeams  Full Text
AUTHORS: Redondo Cubero, A; Corregidor, V; Vazquez, L; Alves, LC;
PUBLISHED: 2015, SOURCE: 14th International Conference on Nuclear Microprobe Technology and Applications (ICNMTA) / Workshop on Proton Beam Writing in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 348
INDEXED IN: Scopus WOS
14
TITLE: Nonuniversality due to inhomogeneous stress in semiconductor surface nanopatterning by low-energy ion-beam irradiation
AUTHORS: Moreno Barrado, A; Castro, M; Gago, R; Vazquez, L; Munoz Garcia, J; Redondo Cubero, A; Galiana, B; Ballesteros, C; Cuerno, R;
PUBLISHED: 2015, SOURCE: PHYSICAL REVIEW B, VOLUME: 91, ISSUE: 15
INDEXED IN: WOS
15
TITLE: Quantitative Chemical Mapping of InGaN Quantum Wells from Calibrated High-Angle Annular Dark Field Micrographs
AUTHORS: Daniel Carvalho; Francisco M Morales; Teresa Ben; Rafael Garcia; Andres Redondo Cubero; Eduardo Alves; Katharina Lorenz; Paul R Edwards; Kevin P O'Donnell; Christian Wetzel;
PUBLISHED: 2015, SOURCE: MICROSCOPY AND MICROANALYSIS, VOLUME: 21, ISSUE: 4
INDEXED IN: WOS CrossRef
16
TITLE: Analysis of the stability of InGaN/GaN multiquantum wells against ion beam intermixing  Full Text
AUTHORS: Redondo Cubero, A; Lorenz, K; Wendler, E; Magalhaes, S; Alves, E; Carvalho, D; Ben, T; Morales, FM; Garcia, R; O'Donnell, KP; Wetzel, C;
PUBLISHED: 2015, SOURCE: NANOTECHNOLOGY, VOLUME: 26, ISSUE: 42
INDEXED IN: Scopus WOS
17
TITLE: Self-consistent depth profiling and imaging of GaN-based transistors using ion microbeams
AUTHORS: Redondo Cubero, A; Corregidor, V; Vázquez, L; Alves, LC;
PUBLISHED: 2015, SOURCE: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, VOLUME: 348
INDEXED IN: Scopus
18
TITLE: Influence of lateral and in- depth metal segregation on the patterning of ohmic contacts for GaN-based devices  Full Text
AUTHORS: Redondo Cubero, A; Vazquez, L; Alves, LC; Corregidor, V; Romero, MF; Pantellini, A; Lanzieri, C; Munoz, E;
PUBLISHED: 2014, SOURCE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 47, ISSUE: 18
INDEXED IN: Scopus WOS
19
TITLE: Comparative analysis of anodized, implanted and sputtered tantalum oxide targets for the study of O-16+O-16 fusion reaction  Full Text
AUTHORS: Silva, H; Cruz, J ; Redondo Cubero, A; Santos, C; Fonseca, M. ; Luis, H; Jesus, AP ;
PUBLISHED: 2014, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 331
INDEXED IN: Scopus WOS CrossRef: 2
20
TITLE: Ion beam analysis: New trends and challenges  Full Text
AUTHORS: Alessandro Zucchiatti; Andres Redondo Cubero;
PUBLISHED: 2014, SOURCE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 331
INDEXED IN: Scopus WOS CrossRef
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