201
TITLE: The influence of bed roughness on the dynamics of gravity currents
AUTHORS: Nogueira, HIS; Adduce, C; Alves, E; Franca, MJ;
PUBLISHED: 2012, SOURCE: 6th International Conference on Fluvial Hydraulics (River Flow) in RIVER FLOW 2012, VOLS 1 AND 2
INDEXED IN: WOS
202
TITLE: THE NEW EC TECHNICAL RECOMMENDATIONS FOR MONITORING INDIVIDUALS OCCUPATIONALLY EXPOSED TO EXTERNAL RADIATION
AUTHORS: Alves, JG; Ambrosi, P; Bartlett, DT; Currivan, L; van Dijk, JWE; Fantuzzi, E; Kamenopoulou, V;
PUBLISHED: 2011, SOURCE: RADIATION PROTECTION DOSIMETRY, VOLUME: 144, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef
203
TITLE: PRELIMINARY ASSESSMENT OF THE DOSE TO THE INTERVENTIONAL RADIOLOGIST IN FLUORO-CT-GUIDED PROCEDURES
AUTHORS: Pereira, MF; Alves, JG; Sarmento, S; Santos, JAM ; Sousa, MJ; Gouvea, M; Oliveira, AD; Cardoso, JV; Santos, LM;
PUBLISHED: 2011, SOURCE: RADIATION PROTECTION DOSIMETRY, VOLUME: 144, ISSUE: 1-4
INDEXED IN: Scopus WOS CrossRef: 13
204
TITLE: Electroless Plating of Au, Pt, or Ru Thin Film Layer on CdZnTe
AUTHORS: Zheng, Q; Dierre, F; Corregidor, V; Crocco, J; Bensalah, H; Plaza, JL; Alves, E; Dieguez, E;
PUBLISHED: 2011, SOURCE: IEEE Nuclear Science Symposium/Medical Imaging Conference (NSS/MIC)/18th International Workshop on Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors in 2011 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE (NSS/MIC)
INDEXED IN: WOS
205
TITLE: The photoluminescence/excitation (PL/E) spectroscopy of Eu-implanted GaN  Full Text
AUTHORS: K.P O’Donnell; I.S Roqan; Ke Wang; Lorenz, K; Alves, E; Boćkowski, M;
PUBLISHED: 2011, SOURCE: Optical Materials, VOLUME: 33, ISSUE: 7
INDEXED IN: CrossRef
IN MY: ORCID
206
TITLE: Optimization Of A Mass Spectrometry Process
AUTHORS: José Lopes ; Corre^a C Alegria; Luís Redondo; Barradas, NP; Alves, E; Jorge Rocha; Floyd D McDaniel; Barney L Doyle;
PUBLISHED: 2011
INDEXED IN: CrossRef
IN MY: ORCID
207
TITLE: <title>Radiation damage formation and annealing in GaN and ZnO</title>
AUTHORS: Lorenz, K; Peres, M; Franco, N; Marques, JG; Miranda, SMC; Magalhães, S; Monteiro, T; Wesch, W; Alves, E; Wendler, E;
PUBLISHED: 2011, SOURCE: Oxide-based Materials and Devices II
INDEXED IN: CrossRef: 30
IN MY: ORCID
209
TITLE: Effect of annealing on AlN/GaN quantum dot heterostructures: advanced ion beam characterization and X-ray study of low-dimensional structures  Full Text
AUTHORS: Magalhães, S; Lorenz, K; Franco, N; Barradas, NP; Alves, E; Monteiro, T; Amstatt, B; Fellmann, V; Daudin, B;
PUBLISHED: 2010, SOURCE: Surface and Interface Analysis - Surf. Interface Anal., VOLUME: 42, ISSUE: 10-11
INDEXED IN: CrossRef: 3
IN MY: ORCID
210
TITLE: Stopping power of 11B in Si and TiO2 measured with a bulk sample method and Bayesian inference data analysis  Full Text
AUTHORS: Siketić, Z; Bogdanović Radović, I; Alves, E; N.P Barradas;
PUBLISHED: 2010, SOURCE: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, VOLUME: 268, ISSUE: 11-12
INDEXED IN: CrossRef
IN MY: ORCID
Page 21 of 27. Total results: 267.