Eduardo José Ramos Morgado
AuthID: R-000-4F2
11
TITLE: Microcrystalline silicon thin films for optical applications Full Text
AUTHORS: Vieira, M ; Morgado, E; Macarico, A; Koynov, S; Schwarz, R ;
PUBLISHED: 1999, SOURCE: 2nd European Conference on Hard Coatings (ETCHC-2)/3rd Iberian Vacuum Meeting (3rd RIVA) in VACUUM, VOLUME: 52, ISSUE: 1-2
AUTHORS: Vieira, M ; Morgado, E; Macarico, A; Koynov, S; Schwarz, R ;
PUBLISHED: 1999, SOURCE: 2nd European Conference on Hard Coatings (ETCHC-2)/3rd Iberian Vacuum Meeting (3rd RIVA) in VACUUM, VOLUME: 52, ISSUE: 1-2
12
TITLE: A two-dimensional visible/infrared detector based on mu c-Si : H p-i-n structures Full Text
AUTHORS: Vieira, M ; Macarico, A; Morgado, E; Koynov, S; Schwarz, R ;
PUBLISHED: 1998, SOURCE: 17th International Conference on Amorphous and Microcrystalline Semiconductors - Science and Technology (ICAMS 17) in JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 227, ISSUE: PART 2
AUTHORS: Vieira, M ; Macarico, A; Morgado, E; Koynov, S; Schwarz, R ;
PUBLISHED: 1998, SOURCE: 17th International Conference on Amorphous and Microcrystalline Semiconductors - Science and Technology (ICAMS 17) in JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 227, ISSUE: PART 2
13
TITLE: Metastable defects and recombination in hydrogenated amorphous silicon
AUTHORS: Morgado, E; Henriques, RT ;
PUBLISHED: 1997, SOURCE: 19th International Conference on Defects in Semiconductors (ICDS-19) in DEFECTS IN SEMICONDUCTORS - ICDS-19, PTS 1-3, VOLUME: 258-2, ISSUE: PART 1
AUTHORS: Morgado, E; Henriques, RT ;
PUBLISHED: 1997, SOURCE: 19th International Conference on Defects in Semiconductors (ICDS-19) in DEFECTS IN SEMICONDUCTORS - ICDS-19, PTS 1-3, VOLUME: 258-2, ISSUE: PART 1
INDEXED IN: 
Scopus 
WOS
Scopus WOS14
TITLE: Transition from tunneling to Poole-Frenkel type transport in aluminum-nitride
AUTHORS: Schwarz, R ; Sun, JJ; Rocha, R ; Morgado, E; Freitas, PP ;
PUBLISHED: 1997, SOURCE: 19th International Conference on Defects in Semiconductors (ICDS-19) in DEFECTS IN SEMICONDUCTORS - ICDS-19, PTS 1-3, VOLUME: 258-2, ISSUE: PART 2
AUTHORS: Schwarz, R ; Sun, JJ; Rocha, R ; Morgado, E; Freitas, PP ;
PUBLISHED: 1997, SOURCE: 19th International Conference on Defects in Semiconductors (ICDS-19) in DEFECTS IN SEMICONDUCTORS - ICDS-19, PTS 1-3, VOLUME: 258-2, ISSUE: PART 2
INDEXED IN: Scopus WOS
Scopus WOS