Francisco Andre Correa Alegria
AuthID: R-000-59K
51
TITLE: Uncertainty of estimates obtained with the histogram test of ADCS
AUTHORS: Alegria, FC; Serra, AC ;
PUBLISHED: 2006, SOURCE: 18th IMEKO World Congress 2006: Metrology for a Sustainable Development in 18th IMEKO World Congress 2006: Metrology for a Sustainable Development, VOLUME: 3
AUTHORS: Alegria, FC; Serra, AC ;
PUBLISHED: 2006, SOURCE: 18th IMEKO World Congress 2006: Metrology for a Sustainable Development in 18th IMEKO World Congress 2006: Metrology for a Sustainable Development, VOLUME: 3
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ORCID52
TITLE: Signal Discrimination in Superheated Droplet Detectors
AUTHORS: Felizardo, M; R.C Martins; A.R Ramos; Morlat, T; Giuliani, F; J.G Marques; Limagne, D; Waysand, G; A.C Fernandes; T.A Girard; Alegria, F;
PUBLISHED: 2006, SOURCE: 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings
AUTHORS: Felizardo, M; R.C Martins; A.R Ramos; Morlat, T; Giuliani, F; J.G Marques; Limagne, D; Waysand, G; A.C Fernandes; T.A Girard; Alegria, F;
PUBLISHED: 2006, SOURCE: 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings
53
TITLE: Signal discrimination in superheated droplet detectors
AUTHORS: Felizardo, M ; Martins, RC ; Ramos, AR ; Morlat, T; Giuliani, F; Marques, JG ; Limagne, D; Waysand, G; Fernandes, AC ; Girard, TA ; Alegria, F;
PUBLISHED: 2005, SOURCE: IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2
AUTHORS: Felizardo, M ; Martins, RC ; Ramos, AR ; Morlat, T; Giuliani, F; Marques, JG ; Limagne, D; Waysand, G; Fernandes, AC ; Girard, TA ; Alegria, F;
PUBLISHED: 2005, SOURCE: IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2
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ORCID54
TITLE: Precision of ADC gain and offset error estimation with the standard histogram test
AUTHORS: Alegria, FC; Serra, AC ;
PUBLISHED: 2005, SOURCE: IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
AUTHORS: Alegria, FC; Serra, AC ;
PUBLISHED: 2005, SOURCE: IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
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ORCID55
TITLE: Measuring channel switching error in data acquisition systems
AUTHORS: Corrêa Alegria, F; Ramos, P; Serra, AC;
PUBLISHED: 2003, SOURCE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
AUTHORS: Corrêa Alegria, F; Ramos, P; Serra, AC;
PUBLISHED: 2003, SOURCE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
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ORCID56
TITLE: Uncertainty in the ADC transition voltages determined with the histogram method
AUTHORS: Corrêa Alegria, F; Cruz Serra, A;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
AUTHORS: Corrêa Alegria, F; Cruz Serra, A;
PUBLISHED: 2001, SOURCE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
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