21
TITLE: Precision of ADC gain and offset error estimation with the standard histogram test
AUTHORS: Alegria, FC; Serra, AC ;
PUBLISHED: 2005, SOURCE: IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
INDEXED IN: Scopus
IN MY: ORCID
Page 3 of 3. Total results: 21.