Chuan Li
AuthID: R-00H-6KR
1
TITLE: On the Effect of Loss Function in GAN Based Data Augmentation for Fault Diagnosis of an Industrial Robot
AUTHORS: Ziqiang Pu; Chuan Li; José Valente de Oliveira ;
PUBLISHED: 2024, SOURCE: Applications of Generative AI
AUTHORS: Ziqiang Pu; Chuan Li; José Valente de Oliveira ;
PUBLISHED: 2024, SOURCE: Applications of Generative AI
INDEXED IN:
Scopus
CrossRef
CrossRef2
TITLE: Sliced Wasserstein cycle consistency generative adversarial networks for fault data augmentation of an industrial robot Full Text
AUTHORS: Pu, Ziqiang; Cabrera, Diego; Li, Chuan; de Oliveira, Jose Valente ;
PUBLISHED: 2023, SOURCE: EXPERT SYSTEMS WITH APPLICATIONS, VOLUME: 222
AUTHORS: Pu, Ziqiang; Cabrera, Diego; Li, Chuan; de Oliveira, Jose Valente ;
PUBLISHED: 2023, SOURCE: EXPERT SYSTEMS WITH APPLICATIONS, VOLUME: 222
3
TITLE: Generative adversarial one-shot diagnosis of transmission faults for industrial robots
AUTHORS: Pu, Ziqiang; Cabrera, Diego; Bai, Yun; Li, Chuan;
PUBLISHED: 2023, SOURCE: ROBOTICS AND COMPUTER-INTEGRATED MANUFACTURING, VOLUME: 83
AUTHORS: Pu, Ziqiang; Cabrera, Diego; Bai, Yun; Li, Chuan;
PUBLISHED: 2023, SOURCE: ROBOTICS AND COMPUTER-INTEGRATED MANUFACTURING, VOLUME: 83
INDEXED IN:
Scopus
WOS
4
TITLE: Sliced Wasserstein cycle consistency generative adversarial networks for fault data augmentation of an industrial robot
AUTHORS: Ziqiang Pu; Diego Cabrera; Chuan Li; José Valente de Oliveira;
PUBLISHED: 2023, SOURCE: Expert Syst. Appl., VOLUME: 222
AUTHORS: Ziqiang Pu; Diego Cabrera; Chuan Li; José Valente de Oliveira;
PUBLISHED: 2023, SOURCE: Expert Syst. Appl., VOLUME: 222
INDEXED IN:
DBLP
5
TITLE: A One-Class Generative Adversarial Detection Framework for Multifunctional Fault Diagnoses
AUTHORS: Pu, ZQ; Cabrera, D; Bai, Y; Li, CA;
PUBLISHED: 2022, SOURCE: IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, VOLUME: 69, ISSUE: 8
AUTHORS: Pu, ZQ; Cabrera, D; Bai, Y; Li, CA;
PUBLISHED: 2022, SOURCE: IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, VOLUME: 69, ISSUE: 8
INDEXED IN:
WOS
6
TITLE: VGAN: Generalizing MSE GAN and WGAN-GP for Robot Fault Diagnosis
AUTHORS: Ziqiang Pu; Diego Cabrera; Chuan Li; José Valente de Oliveira ;
PUBLISHED: 2022, SOURCE: IEEE Intell. Syst., VOLUME: 37, ISSUE: 3
AUTHORS: Ziqiang Pu; Diego Cabrera; Chuan Li; José Valente de Oliveira ;
PUBLISHED: 2022, SOURCE: IEEE Intell. Syst., VOLUME: 37, ISSUE: 3
INDEXED IN:
DBLP
7
TITLE: Fusing convolutional generative adversarial encoders for 3D printer fault detection with only normal condition signals Full Text
AUTHORS: Li, C; Cabrera, D; Sancho, F; Sanchez, RV; Cerrada, M; Long, JY; de Oliveira, JV ;
PUBLISHED: 2021, SOURCE: MECHANICAL SYSTEMS AND SIGNAL PROCESSING, VOLUME: 147
AUTHORS: Li, C; Cabrera, D; Sancho, F; Sanchez, RV; Cerrada, M; Long, JY; de Oliveira, JV ;
PUBLISHED: 2021, SOURCE: MECHANICAL SYSTEMS AND SIGNAL PROCESSING, VOLUME: 147
8
TITLE: Regression modeling for enterprise electricity consumption: A comparison of recurrent neural network and its variants
AUTHORS: Yun Bai; Jingjing J Xie; Chao Liu; Ying Tao; Bo Zeng; Chuan Li;
PUBLISHED: 2021, SOURCE: INTERNATIONAL JOURNAL OF ELECTRICAL POWER & ENERGY SYSTEMS, VOLUME: 126
AUTHORS: Yun Bai; Jingjing J Xie; Chao Liu; Ying Tao; Bo Zeng; Chuan Li;
PUBLISHED: 2021, SOURCE: INTERNATIONAL JOURNAL OF ELECTRICAL POWER & ENERGY SYSTEMS, VOLUME: 126
INDEXED IN:
Scopus
WOS
9
TITLE: Fault Diagnosis for Wind Turbine Gearboxes by Using Deep Enhanced Fusion Network
AUTHORS: Ziqiang Q Pu; Chuan Li; Shaohui H Zhang; Yun Bai;
PUBLISHED: 2021, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 70
AUTHORS: Ziqiang Q Pu; Chuan Li; Shaohui H Zhang; Yun Bai;
PUBLISHED: 2021, SOURCE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 70
INDEXED IN:
Scopus
WOS
10
TITLE: A manufacturing quality prediction model based on AdaBoost-LSTM with rough knowledge Full Text
AUTHORS: Bai, Y; Xie, JJ; Wang, DQ; Zhang, WJ; Li, C;
PUBLISHED: 2021, SOURCE: COMPUTERS & INDUSTRIAL ENGINEERING, VOLUME: 155
AUTHORS: Bai, Y; Xie, JJ; Wang, DQ; Zhang, WJ; Li, C;
PUBLISHED: 2021, SOURCE: COMPUTERS & INDUSTRIAL ENGINEERING, VOLUME: 155
INDEXED IN:
Scopus
WOS