Isabel Maria Silva Nobre Parreira Cacho Teixeira
AuthID: R-000-6DS
21
TITLE: An Overview of the Clear-PEM Breast Imaging Scanner
AUTHORS: Albuquerque, E; Almeida, FG ; Almeida, P ; Auffray, E; Barbosa, J; Bastos, AL; Bexiga, V; Bugalho, R; Carmona, S; Carrico, B; Ferreira, CS; Ferreira, NC; Ferreira, M; Frade, M; Godinho, J; Goncalves, F ; Guerreiro, C; Lecoq, P; Leong, C; Lousa, P; ...More
PUBLISHED: 2009, SOURCE: IEEE Nuclear Science Symposium/Medical Imaging Conference in 2008 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE (2008 NSS/MIC), VOLS 1-9
AUTHORS: Albuquerque, E; Almeida, FG ; Almeida, P ; Auffray, E; Barbosa, J; Bastos, AL; Bexiga, V; Bugalho, R; Carmona, S; Carrico, B; Ferreira, CS; Ferreira, NC; Ferreira, M; Frade, M; Godinho, J; Goncalves, F ; Guerreiro, C; Lecoq, P; Leong, C; Lousa, P; ...More
PUBLISHED: 2009, SOURCE: IEEE Nuclear Science Symposium/Medical Imaging Conference in 2008 IEEE NUCLEAR SCIENCE SYMPOSIUM AND MEDICAL IMAGING CONFERENCE (2008 NSS/MIC), VOLS 1-9
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TITLE: The CMS experiment at the CERN LHC
AUTHORS: Chatrchyan, S; Hmayakyan, G; Khachatryan, V; Sirunyan, AM; Adam, W; Bauer, T; Bergauer, T; Bergauer, H; Dragicevic, M; Eroe, J; Friedl, M; Fruehwirth, R; Ghete, VM; Glaser, P; Hartl, C; Hoermann, N; Hrubec, J; Haensel, S; Jeitler, M; Kastner, K; ...More
PUBLISHED: 2008, SOURCE: JOURNAL OF INSTRUMENTATION, VOLUME: 3, ISSUE: 8
AUTHORS: Chatrchyan, S; Hmayakyan, G; Khachatryan, V; Sirunyan, AM; Adam, W; Bauer, T; Bergauer, T; Bergauer, H; Dragicevic, M; Eroe, J; Friedl, M; Fruehwirth, R; Ghete, VM; Glaser, P; Hartl, C; Hoermann, N; Hrubec, J; Haensel, S; Jeitler, M; Kastner, K; ...More
PUBLISHED: 2008, SOURCE: JOURNAL OF INSTRUMENTATION, VOLUME: 3, ISSUE: 8
INDEXED IN: Scopus WOS
IN MY: ORCID
23
TITLE: The CMS experiment at the CERN LHC
AUTHORS: The CMS Collaboration; Chatrchyan, S; Hmayakyan, G; Khachatryan, V; Sirunyan, AM; Adam, W; Bauer, T; Bergauer, T; Bergauer, H; Dragicevic, M; Erö, J; Friedl, M; Frühwirth, R; Ghete, VM; Glaser, P; Hartl, C; Hoermann, N; Hrubec, J; Hänsel, S; Jeitler, M; ...More
PUBLISHED: 2008, SOURCE: J. Inst. - Journal of Instrumentation, VOLUME: 3, ISSUE: 08
AUTHORS: The CMS Collaboration; Chatrchyan, S; Hmayakyan, G; Khachatryan, V; Sirunyan, AM; Adam, W; Bauer, T; Bergauer, T; Bergauer, H; Dragicevic, M; Erö, J; Friedl, M; Frühwirth, R; Ghete, VM; Glaser, P; Hartl, C; Hoermann, N; Hrubec, J; Hänsel, S; Jeitler, M; ...More
PUBLISHED: 2008, SOURCE: J. Inst. - Journal of Instrumentation, VOLUME: 3, ISSUE: 08
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TITLE: Editorial: Design of circuits and integrated systems Full Text
AUTHORS: Paulo Teixeira, J; Silva Matos, J; Tomas, J; Cacho Teixeira, I;
PUBLISHED: 2007, SOURCE: IET Computers & Digital Techniques - IET Comput. Digit. Tech., VOLUME: 1, ISSUE: 5
AUTHORS: Paulo Teixeira, J; Silva Matos, J; Tomas, J; Cacho Teixeira, I;
PUBLISHED: 2007, SOURCE: IET Computers & Digital Techniques - IET Comput. Digit. Tech., VOLUME: 1, ISSUE: 5
25
TITLE: Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip Full Text
AUTHORS: Barros B Júnior; Rodriguez-Irago, M; Santos, MB; Teixeira, IC; Vargas, F; Teixeira, JP;
PUBLISHED: 2005, SOURCE: J Electron Test - Journal of Electronic Testing, VOLUME: 21, ISSUE: 4
AUTHORS: Barros B Júnior; Rodriguez-Irago, M; Santos, MB; Teixeira, IC; Vargas, F; Teixeira, JP;
PUBLISHED: 2005, SOURCE: J Electron Test - Journal of Electronic Testing, VOLUME: 21, ISSUE: 4
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TITLE: First Experimental Results with the ClearPEM Detector
AUTHORS: M.C Abreu; J.D Aguiar; Albuquerque, E; F.G Almeida ; Almeida, P; Amaral, P; Bento, P; Bugalho, R; Carrico, B; Cordeiro, H; Ferreira, M; N.C Ferreira; Goncalves, F; Leong, C; Lopes, F; Lousa, P; M.V Martins; Matela, N; P.R Mendes; Moura, R; ...More
PUBLISHED: 2005, SOURCE: IEEE Nuclear Science Symposium Conference Record, 2005
AUTHORS: M.C Abreu; J.D Aguiar; Albuquerque, E; F.G Almeida ; Almeida, P; Amaral, P; Bento, P; Bugalho, R; Carrico, B; Cordeiro, H; Ferreira, M; N.C Ferreira; Goncalves, F; Leong, C; Lopes, F; Lousa, P; M.V Martins; Matela, N; P.R Mendes; Moura, R; ...More
PUBLISHED: 2005, SOURCE: IEEE Nuclear Science Symposium Conference Record, 2005
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TITLE: Self-checking and fault tolerance quality assessment using Fault Sampling
AUTHORS: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2002, SOURCE: 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems in 17TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS
AUTHORS: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2002, SOURCE: 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems in 17TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS
INDEXED IN: WOS CrossRef
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TITLE: Optimizing functional distribution in complex system design
AUTHORS: Dias, OP; Teixeira, IM; Teixeira, JP; Becker, LB; Pereira, CE;
PUBLISHED: 2001, SOURCE: IFIP WG10 3/WG10 4/WG10 5 International Workshop on Distributed and Parallel Embedded Systems (DIPES 2000) in ARCHITECTURE AND DESIGN OF DISTRIBUTED EMBEDDED SYSTEMS, VOLUME: 61
AUTHORS: Dias, OP; Teixeira, IM; Teixeira, JP; Becker, LB; Pereira, CE;
PUBLISHED: 2001, SOURCE: IFIP WG10 3/WG10 4/WG10 5 International Workshop on Distributed and Parallel Embedded Systems (DIPES 2000) in ARCHITECTURE AND DESIGN OF DISTRIBUTED EMBEDDED SYSTEMS, VOLUME: 61
INDEXED IN: Scopus WOS
29
TITLE: RTL design validation, DFT and test pattern generation for high defects coverage
AUTHORS: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2001, SOURCE: IEEE European Test Workshop (ETW 01) in ETW 2001: IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
AUTHORS: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2001, SOURCE: IEEE European Test Workshop (ETW 01) in ETW 2001: IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
INDEXED IN: WOS
30
TITLE: Design and test of certifiable ASICs for safety-critical gas burners control
AUTHORS: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2001, SOURCE: 7th IEEE International On-Line Testing Workshop in SEVENTH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, PROCEEDINGS
AUTHORS: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2001, SOURCE: 7th IEEE International On-Line Testing Workshop in SEVENTH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, PROCEEDINGS
INDEXED IN: WOS